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Paper
Impact of Channel Engineering on Unity Gain Frequency and Noise-Figure in 90nm NMOS Transistor for RF Applications.
R. Srinivasan
,
Navakanta Bhat
Venue
National
VLSID
Year
2005
Proceedings
VLSI Design
DBLP record
conf/vlsid/SrinivasanB05 ↗
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