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On diagnosis of faults in a scan-chain.

VenueNationalVTS

Year1993

ProceedingsVTS

DBLP recordconf/vts/Kundu93 ↗

Browse the full VTS paper archive.

Subfields

Artificial Intelligence
Machine Learning
Computer Vision
Natural Language Processing
Security and Privacy
Systems and Networking
Databases and Data Management
Data Science and Information Retrieval

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