| 2026 | VLSID | Thermal Runaway Analysis of Analog PIM Accelerators. | Huatao Wu, Sandip Kundu |
| 2025 | VLSID | A Study on Efficiency Improvements of DNN Accelerators via Denormalized Arithmetic Elimination. | Alexander Kharitonov, Sandip Kundu |
| 2024 | DATE | Memory Scraping Attack on Xilinx FPGAs: Private Data Extraction from Terminated Processes. | Bharadwaj Madabhushi, Sandip Kundu, Daniel E. Holcomb |
| 2023 | DATE | A Novel Fault-Tolerant Architecture for Tiled Matrix Multiplication. | Sandeep Bal, Chandra Sekhar Mummidi, Victor da Cruz Ferreira, Sudarshan Srinivasan, Sandip Kundu |
| 2022 | ICCD | A Highly-Efficient Error Detection Technique for General Matrix Multiplication using Tiled Processing on SIMD Architecture. | Chandra Sekhar Mummidi, Sandeep Bal, Brunno F. Goldstein, Sudarshan Srinivasan, Sandip Kundu |
| 2022 | IOLTS | A Software Approach Towards Defeating Power Management Side Channel Leakage. | Md. Nazmul Islam, Sandip Kundu |
| 2022 | VTC | Reinforcement Learning based Multi-Attribute Slice Admission Control for Next-Generation Networks in a Dynamic Pricing Environment. | Victor da Cruz Ferreira, Haitham H. Esmat, Beatriz Lorenzo, Sandip Kundu, Felipe M. G. Frana |
| 2021 | DSN | MILR: Mathematically Induced Layer Recovery for Plaintext Space Error Correction of CNNs. | Jonathan Ponader, Kyle Thomas, Sandip Kundu, Yan Solihin |
| 2020 | ESANN | Towards Adversarial Attack Resistant Deep Neural Networks. | Tiago A. O. Alves, Sandip Kundu |
| 2020 | IOLTS | Reduced Fault Coverage as a Target for Design Scaffolding Security. | Irith Pomeranz, Sandip Kundu |
| 2019 | DASC | Hardware-Accelerated Similarity Search with Multi-Index Hashing. | Leandro Santiago de Arajo, Victor da Cruz Ferreira, Brunno Figueiroa Goldstein, Alexandre Solon Nery, Leandro Augusto Justen Marzulo, Sandip Kundu, Felipe Maia Galvo Frana |
| 2019 | ESANN | Memory Efficient Weightless Neural Network using Bloom Filter. | Leandro Santiago de Arajo, Letcia Dias Verona, Fbio Medeiros Rangel, Fabrcio Firmino de Faria, Daniel Sadoc Menasch, Wouter Caarls, Maurcio Breternitz, Sandip Kundu, Priscila Machado Vieira Lima, Felipe Maia Galvo Frana |
| 2018 | ASPDAC | PMU-Trojan: On exploiting power management side channel for information leakage. | Md. Nazmul Islam, Sandip Kundu |
| 2017 | ISCAS | A guide to graceful aging: How not to overindulge in post-silicon burn-in for enhancing reliability of weak PUF. | Md. Nazmul Islam, Vinay C. Patil, Sandip Kundu |
| 2017 | VTS | An analytical model for predicting the residual life of an IC and design of residual-life meter. | Md. Nazmul Islam, Sandip Kundu |
| 2016 | ICCD | Improving performance per Watt of non-monotonic Multicore Processors via bottleneck-based online program phase classification. | Sudarshan Srinivasan, Israel Koren, Sandip Kundu |
| 2016 | VLSID | Efficient Error-Detection and Recovery Mechanisms for Reliability and Resiliency of Multicores. | Sandip Kundu, Omer Khan |
| 2016 | VLSID | Dynamic Reconfiguration vs. DVFS: A Comparative Study on Power Efficiency of Processors. | Sudarshan Srinivasan, Nithesh Kurella, Israel Koren, Sandip Kundu |
| 2016 | VLSID | An Efficient Method for Clock Skew Scheduling to Reduce Peak Current. | Arunkumar Vijayakumar, Vinay C. Patil, Sandip Kundu |
| 2015 | DATE | A novel modeling attack resistant PUF design based on non-linear voltage transfer characteristics. | Arunkumar Vijayakumar, Sandip Kundu |
| 2015 | ICCD | Online mechanism for reliability and power-efficiency management of a dynamically reconfigurable core. | Sudarshan Srinivasan, Israel Koren, Sandip Kundu |
| 2014 | IOLTS | Online error detection and recovery in dataflow execution. | Tiago A. O. Alves, Sandip Kundu, Leandro A. J. Marzulo, Felipe Maia Galvo Frana |
| 2014 | VLSID | On Manufacturing Aware Physical Design to Improve the Uniqueness of Silicon-Based Physically Unclonable Functions. | Raghavan Kumar, Siva Nishok Dhanuskodi, Sandip Kundu |
| 2014 | VLSID | Performance and Power Benefits of Sharing Execution Units between a High Performance Core and a Low Power Core. | Rance Rodrigues, Israel Koren, Sandip Kundu |
| 2013 | ICCD | On dynamic polymorphing of a superscalar core for improving energy efficiency. | Sudarshan Srinivasan, Rance Rodrigues, Arunachalam Annamalai, Israel Koren, Sandip Kundu |
| 2013 | ICCD | Managing test coverage uncertainty due to thermal noise in nano-CMOS: A case-study on an SRAM array. | Vikram B. Suresh, Sandip Kundu |
| 2013 | VLSID | Impact of Clock-Gating on Power Distribution Network Using Wavelet Analysis. | Vinay C. Patil, Sudarshan Srinivasan, Wayne P. Burleson, Sandip Kundu |
| 2012 | SBAC-PAD | Scalable Thread Scheduling in Asymmetric Multicores for Power Efficiency. | Rance Rodrigues, Arunachalam Annamalai, Israel Koren, Sandip Kundu |
| 2011 | DATE | On testing prebond dies with incomplete clock networks in a 3D IC using DLLs. | Michael Buttrick, Sandip Kundu |
| 2011 | DATE | Modeling manufacturing process variation for design and test. | Sandip Kundu, Aswin Sreedhar |
| 2011 | DATE | On design of test structures for lithographic process corner identification. | Aswin Sreedhar, Sandip Kundu |
| 2011 | DATE | Physically unclonable functions for embeded security based on lithographic variation. | Aswin Sreedhar, Sandip Kundu |
| 2011 | ICCD | Task model for on-chip communication infrastructure design for multicore systems. | Bharath Phanibhushana, Kunal P. Ganeshpure, Sandip Kundu |
| 2011 | IOLTS | On graceful degradation of microprocessors in presence of faults via resource banking. | Rance Rodrigues, Sandip Kundu |
| 2011 | IOLTS | On graceful degradation of chip multiprocessors in presence of faults via flexible pooling of critical execution units. | Rance Rodrigues, Sandip Kundu |
| 2011 | ITC | Lithography aware critical area estimation and yield analysis. | Priyamvada Vijayakumar, Vikram B. Suresh, Sandip Kundu |
| 2010 | ICCD | A study on performance benefits of core morphing in an asymmetric multicore processor. | Anup Das, Rance Rodrigues, Israel Koren, Sandip Kundu |
| 2010 | ITC | Modeling the impact of process variation on resistive bridge defects. | S. Saqib Khursheed, Shida Zhong, Robert C. Aitken, Bashir M. Al-Hashimi, Sandip Kundu |
| 2010 | ITC | Shadow checker (SC): A low-cost hardware scheme for online detection of faults in small memory structures of a microprocessor. | Rance Rodrigues, Sandip Kundu, Omer Khan |
| 2010 | VLSID | Optical Lithography Simulation with Focus Variation using Wavelet Transform. | Rance Rodrigues, Sandip Kundu |
| 2009 | DATE | A self-adaptive system architecture to address transistor aging. | Omer Khan, Sandip Kundu |
| 2009 | DATE | Hardware/software co-design architecture for thermal management of chip multiprocessors. | Omer Khan, Sandip Kundu |
| 2009 | DATE | A study on placement of post silicon clock tuning buffers for mitigating impact of process variation. | Kelageri Nagaraj, Sandip Kundu |
| 2009 | DATE | Improving yield and reliability of chip multiprocessors. | Abhisek Pan, Omer Khan, Sandip Kundu |
| 2009 | DATE | On linewidth-based yield analysis for nanometer lithography. | Aswin Sreedhar, Sandip Kundu |
| 2009 | ICCD | Optical lithography simulation using wavelet transform. | Rance Rodrigues, Aswin Sreedhar, Sandip Kundu |
| 2009 | ICCD | Statistical timing analysis based on simulation of lithographic process. | Aswin Sreedhar, Sandip Kundu |
| 2009 | VLSID | An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate Delays. | Kunal P. Ganeshpure, Sandip Kundu |
| 2008 | DATE | On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits. | Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu |
| 2008 | DDECS | The Guiding Light for Chip Testing. | Sandip Kundu |
| 2008 | ICCAD | A framework for predictive dynamic temperature management of microprocessor systems. | Omer Khan, Sandip Kundu |
| 2008 | ICCD | Modeling and analysis of non-rectangular transistors caused by lithographic distortions. | Aswin Sreedhar, Sandip Kundu |
| 2008 | IOLTS | A Built-In Self-Test Scheme for Soft Error Rate Characterization. | Alodeep Sanyal, Syed M. Alam, Sandip Kundu |
| 2008 | ITC | An Automatic Post Silicon Clock Tuning System for Improving System Performance based on Tester Measurements. | Kelageri Nagaraj, Sandip Kundu |
| 2008 | ITC | Statistical Yield Modeling for Sub-wavelength Lithography. | Aswin Sreedhar, Sandip Kundu |
| 2008 | VLSID | On Common-Mode Skewed-Load and Broadside Tests. | Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu |
| 2007 | DAC | On Estimating Impact of Loading Effect on Leakage Current in Sub-65nm Scaled CMOS Circuits Based on Newton-Raphson Method. | Ashesh Rastogi, Wei Chen, Sandip Kundu |
| 2007 | DATE | Interactive presentation: Automatic test pattern generation for maximal circuit noise in multiple aggressor crosstalk faults. | Kunal P. Ganeshpure, Sandip Kundu |
| 2007 | ICCD | On modeling impact of sub-wavelength lithography on transistors. | Aswin Sreedhar, Sandip Kundu |
| 2007 | IOLTS | Accelerating Soft Error Rate Testing Through Pattern Selection. | Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu |
| 2007 | IOLTS | On Derating Soft Error Probability Based on Strength Filtering. | Alodeep Sanyal, Sandip Kundu |
| 2007 | ISCAS | A Study on Impact of Leakage Current on Dynamic Power. | Ashesh Rastogi, Kunal P. Ganeshpure, Sandip Kundu |
| 2007 | ITC | On ATPG for multiple aggressor crosstalk faults in presence of gate delays. | Kunal P. Ganeshpure, Sandip Kundu |
| 2007 | VLSID | An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect. | Ashesh Rastogi, Wei Chen, Alodeep Sanyal, Sandip Kundu |
| 2006 | DATE | A design for failure analysis (DFFA) technique to ensure incorruptible signatures. | Sandip Kundu |
| 2006 | ICCD | A Pattern Generation Technique for Maximizing Power Supply Currents. | Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu |
| 2006 | ICCD | Power Droop Testing. | Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd Becker |
| 2006 | IOLTS | An Improved Technique for Reducing False Alarms Due to Soft Errors. | Sandip Kundu, Ilia Polian |
| 2006 | VLSID | Test Pattern Generation for Power Supply Droop Faults. | Debasis Mitra, Subhasis Bhattacharjee, Susmita Sur-Kolay, Bhargab B. Bhattacharya, Sujit T. Zachariah, Sandip Kundu |
| 2005 | ETS | Path-oriented transition fault test generation considering operating conditions. | Bharath Seshadri, Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu |
| 2005 | ITC | Transient fault characterization in dynamic noisy environments. | Ilia Polian, John P. Hayes, Sandip Kundu, Bernd Becker |
| 2005 | VTS | Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies. | Ilia Polian, Sandip Kundu, Jean-Marc Gallire, Piet Engelke, Michel Renovell, Bernd Becker |
| 2004 | DATE | A Modeling Approach for Addressing Power Supply Switching Noise Related Failures of Integrated Circuit. | Chandra Tirumurti, Sandip Kundu, Susmita Sur-Kolay, Yi-Shing Chang |
| 2004 | ICCAD | Static statistical timing analysis for latch-based pipeline designs. | Rob A. Rutenbar, Li-C. Wang, Kwang-Ting Cheng, Sandip Kundu |
| 2004 | ITC | Trends in manufacturing test methods and their implications. | Sandip Kundu, T. M. Mak, Rajesh Galivanche |
| 2003 | DATE | Circuit and Platform Design Challenges in Technologies beyond 90nm. | Bill Grundmann, Rajesh Galivanche, Sandip Kundu |
| 2003 | DATE | On the Characterization of Hard-to-Detect Bridging Faults. | Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu |
| 2003 | DATE | On Modeling Cross-Talk Faults. | Sujit T. Zachariah, Yi-Shing Chang, Sandip Kundu, Chandra Tirumurti |
| 2003 | ETS | On path selection for delay fault testing considering operating conditions [logic IC testing]. | Bharath Seshadri, Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu |
| 2003 | ITC | On-chip Compression of Output Responses with Unknown Values Using LFSR Reseeding. | Masao Naruse, Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu |
| 2002 | DAC | On output response compression in the presence of unknown output values. | Irith Pomeranz, Sandip Kundu, Sudhakar M. Reddy |
| 2001 | DAC | Fast Statistical Timing Analysis By Probabilistic Event Propagation. | Jing-Jia Liou, Kwang-Ting Cheng, Sandip Kundu, Angela Krstic |
| 2001 | VLSID | On Fault-Simulation Through Embedded Memories On Large Industrial Designs. | Sitaram Yadavalli, Sandip Kundu |
| 2000 | ASPDAC | Performance sensitivity analysis using statistical method and its applications to delay. | Jing-Jia Liou, Angela Krstic, Kwang-Ting Cheng, Deb Aditya Mukherjee, Sandip Kundu |
| 2000 | ETS | Test challenges in nanometer technologies. | Sandip Kundu, Sanjay Sengupta, Rajesh Galivanche |
| 1999 | ICCD | On Detecting Bridges Causing Timing Failures. | Sreenivas Mandava, Sreejit Chakravarty, Sandip Kundu |
| 1998 | ASPDAC | Timing Analysis and Optimization: From Devices to Systems (Abstract of Embedded Tutorial). | Anirudh Devgan, Sandip Kundu |
| 1998 | ITC | GateMaker: a transistor to gate level model extractor for simulation, automatic test pattern generation and verification. | Sandip Kundu |
| 1997 | DATE | Inductance analysis of on-chip interconnects [deep submicron CMOS]. | Sandip Kundu, Uttam Ghoshal |
| 1997 | ICCAD | Timing analysis and optimization: from devices to systems (tutorial). | Anirudh Devgan, Leon Stok, Sandip Kundu |
| 1994 | DAC | Microprocessor Testing: Which Technique is Best? (Panel). | Jacob A. Abraham, Sandip Kundu, Janak H. Patel, Manuel A. d'Abreu, Bulent I. Dervisoglu, Marc E. Levitt, Hector R. Sucar, Ron G. Walther |
| 1994 | ICCAD | Incremental synthesis. | Daniel Brand, Anthony D. Drumm, Sandip Kundu, Prakash Narain |
| 1994 | ICCD | Multifault Testable Circuits Based on Binary Parity Diagrams. | Sandip Kundu |
| 1993 | ITC | Design of Scan-Based Path-Delay-Testable Sequential Circuits. | Ankan K. Pramanick, Sandip Kundu |
| 1993 | VTS | On diagnosis of faults in a scan-chain. | Sandip Kundu |
| 1993 | VTS | Testability preserving Boolean transforms for logic synthesis. | Sandip Kundu, Ankan K. Pramanick |
| 1992 | ITC | A Small Test Generator for Large Designs. | Sandip Kundu, Leendert M. Huisman, Indira Nair, Vijay S. Iyengar, Lakshmi N. Reddy |
| 1989 | ICCD | Design of TSC checkers for implementation in CMOS technology. | Sandip Kundu, Sudhakar M. Reddy |
| 1988 | ICCAD | On the design of robust multiple fault testable CMOS combinational logic circuits. | Sandip Kundu, Sudhakar M. Reddy, Niraj K. Jha |
| 1988 | ITC | Robust Tests for Parity Trees. | Sandip Kundu, Sudhakar M. Reddy |