Ajay Khoche
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
16
Venues
3
Active years
1992–2010
Best venue rank
National
Where they publish
Papers
16 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2010 | ITC | STIL P1450.4: A standard for test flow specification. | Jim O'Reilly, Ajay Khoche, Ernst Wahl, Bruce R. Parnas |
| 2009 | VTS | STDF Memory Fail Datalog Standard. | Ajay Khoche, Jay Katz, Sauro Landini, Kochen Liao, Neetu Agrawal, Glenn Plowman, Songlin Zuo, Liyang Lai, John Rowe, Thomas Zanon |
| 2008 | ITC | A Tutorial on STDF Fail Datalog Standard. | Ajay Khoche, Phil Burlison, John Rowe, Glenn Plowman |
| 2006 | ITC | Selective and Accurate Fail Data Capture in Compression Environment for Volume Diagnostics. | Ajay Khoche, Domenico Chindamo, Michael Braun, Martin Fischer |
| 2006 | VTS | Session Abstract. | Ajay Khoche |
| 2006 | VTS | Session Abstract. | Ajay Khoche, Peter Muhmenthaler |
| 2006 | VTS | Session Abstract. | Ajay Khoche, Mike Rodgers, Pete O'Neil |
| 2002 | ITC | Packet-Based Input Test Data Compression Techniques. | Erik H. Volkerink, Ajay Khoche, Subhasish Mitra |
| 2002 | VTS | Test Vector Compression Using EDA-ATE Synergies. | Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra |
| 2002 | VTS | Test Economics for Multi-site Test with Modern Cost Reduction Techniques. | Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges |
| 2001 | ITC | A new methodology for improved tester utilization. | Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir |
| 2001 | ITC | Tackling test trade-offs from design, manufacturing to market using economic modeling. | Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff |
| 1997 | ITC | ACT: A DFT Tool for Self-Timed Circuits. | Ajay Khoche, Erik Brunvand |
| 1997 | VTS | Critical hazard free test generation for asynchronous circuits. | Ajay Khoche, Erik Brunvand |
| 1995 | VTS | A partial scan methodology for testing self-timed circuits. | Ajay Khoche, Erik Brunvand |
| 1992 | VLSID | A Behavioral Fault Simulator For Ideal. | Ajay Khoche, Sunil D. Sherlekar, G. Venkatesh |