Albert Au
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
8
Venues
4
Active years
2014–2026
Best venue rank
B
Where they publish
Papers
8 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | ETS | An Enhanced, Self-Adapting Asynchronous Interface for High-Frequency IJTAG Instruments In Clock Mesh Environments. | Luc Romain, Katarzyna Wojnowska, Roger Mah, Albert Au, Wei Zou, Martin Keim |
| 2026 | ETS | Memory ECC Logic Testing using MBIST. | Wei Zou, Artur Pogiel, Martin Keim, Albert Au, Jongsin Yun, Luc Romain |
| 2025 | ETS | A Novel BIST Method for Multi-Port Register Files. | Andy Chen, Vianney Choserot, Munish Kumar, Khushal Gelda, Shreyas Pramod Dixit, Wei Zou, Jongsin Yun, Harshitha Kodali, Albert Au, Lori Schramm, Martin Keim |
| 2025 | ETS | Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance. | Vinayak Bharat Naik, Gregory Billus, Amit Kumar Shukla, Andre Vogel, Veit Kriegerstein, Patrick Scharf, Venkata Siva Komma, Johannes Mueller, Thomas Merbeth, Ralf Flemming, Ingolf Lorenz, Muthu Kumaran Nambi, Ee Ee Yeoh, Hemavathi Chaya, Siddharth Gupta, Yentsai Huang, Sushma Sambatur, Joerg Winkler, Tom Andre, Shane Hollmer, Steven Soss, Jongsin Yun, Wei Zou, Harshitha Kodali, Luc Romain, Albert Au, Lori Schramm, Martin Keim |
| 2025 | ITC | Early Testing of Memory Redundant Row Elements. | Luc Romain, Roger Mah, Katarzyna Wojnowska, Albert Au, Lori Schramm |
| 2025 | VTS | Periodic Non-Destructive Memory BIST for Automotive Applications. | Wei Zou, Artur Pogiel, Albert Au, Martin Keim |
| 2024 | ITC | Power-Aware Test Scheduling for Memory BIST. | Albert Au, Michal Kpinski, Makary Orczyk, Artur Pogiel |
| 2014 | DDECS | Quality assurance in memory built-in self-test tools. | Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada |