| 2001 | ISCAS | Scheduling tests for low power built-in self-test. | Tobias Schle, Albrecht P. Stroele |
| 2001 | VTS | Test Scheduling for Minimal Energy Consumption under Power Constraints. | Tobias Schle, Albrecht P. Stroele |
| 2000 | ISCAS | Synthesizing data paths with arithmetic self-test. | Albrecht P. Stroele |
| 2000 | VLSID | A Versatile BIST Technique Combining Test Registers and Accumulators. | Frank Mayer, Albrecht P. Stroele |
| 2000 | VTS | Synthesis for Arithmetic Built-In Self-Tes. | Albrecht P. Stroele |
| 1999 | VTS | Programmable Embedded Self-Testing Checkers for All-Unidirectional Error-Detecting Code. | Albrecht P. Stroele, Steffen Tarnick |
| 1998 | ITC | Embedded self-testing checkers for low-cost arithmetic codes. | Steffen Tarnick, Albrecht P. Stroele |
| 1998 | VTS | Bit Serial Pattern Generation and Response Compaction Using Arithmetic Functions. | Albrecht P. Stroele |
| 1997 | VTS | Methods to reduce test application time for accumulator-based self-test. | Albrecht P. Stroele, Frank Mayer |
| 1996 | ICCD | Arithmetic Pattern Generators for Built-In Self-Test. | Albrecht P. Stroele |
| 1996 | VTS | Test response compaction using arithmetic functions. | Albrecht P. Stroele |
| 1995 | ICCAD | Test register insertion with minimum hardware cost. | Albrecht P. Stroele, Hans-Joachim Wunderlich |
| 1995 | ISCAS | A Self-Test Approach Using Accumulators as Test Pattern Generators. | Albrecht P. Stroele |
| 1995 | VTS | Signature analysis and aliasing for sequential circuits. | Albrecht P. Stroele |
| 1994 | ITC | Configuring Flip-Flops to BIST Registers. | Albrecht P. Stroele, Hans-Joachim Wunderlich |
| 1992 | ITC | Self-Test Scheduling with Bounded Test Execution. | Albrecht P. Stroele |
| 1990 | ITC | Error masking in self-testable circuits. | Albrecht P. Stroele, Hans-Joachim Wunderlich |