| 1995 | ICCD | Efficient testability enhancement for combinational circuit. | Yu Fang, Alexander Albicki |
| 1995 | ICCD | Low power and high speed multiplication design through mixed number representations. | Menghui Zheng, Alexander Albicki |
| 1994 | ICCD | Reducing Power Dissipation in Serially Connected MOSFET Circuits via Transistor Reordering. | Razak Hossain, Menghui Zheng, Alexander Albicki |
| 1994 | VTS | New advances in path delay fault testing of combinational circuits. | Xiaodong Xie, Alexander Albicki |
| 1993 | ICCD | Bit-Splitting for Testability Enhancement in Scan-Based Design. | Xiaodong Xie, Alexander Albicki |
| 1993 | ISCAS | Double Edge Triggered Devices: Speed and Power Considerations. | Razak Hossain, Leszek D. Wronski, Alexander Albicki |
| 1992 | ICCD | Design of Robust-Path-Delay-Fault-Testable Combinational Circuits by Boolean Space Expansion. | Xiaodong Xie, Alexander Albicki, Andrzej Krasniewski |
| 1991 | ICCD | Random Testability of Redundant Circuits. | Andrzej Krasniewski, Alexander Albicki |
| 1989 | ICCD | An algorithm for voice and data integration on packet-switched local area networks. | Christopher Bucci, Alexander Albicki |
| 1988 | LCN | Prioritized access in CSMA networks: a node partitioning approach. | Rajiv Arora, Alexander Albicki |
| 1985 | DAC | Simulation-free estimation of speed degradation in NMOS self-testing circuits for CAD applications. | Andrzej Krasniewski, Alexander Albicki |
| 1985 | ITC | Automatic Design of Exhaustively Self-Testing Chips with Bilbo Modules. | Andrzej Krasniewski, Alexander Albicki |
| 1985 | ITC | Evaluation ot Monitor Complexity for Concurrently Testing Microprogrammed Control Units. | Carl Staelin, Alexander Albicki |