Alvin Jee
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
3
Active years
1993–2002
Best venue rank
National
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2002 | IOLTS | Defect-Oriented Analysis of Memory BIST Tests. | Alvin Jee |
| 2002 | ITC | An Integrated Approach to Yield Loss Characterization. | Mark Craig, Alvin Jee, Prashant Maniar |
| 1997 | VTS | A methodolgy for characterizing cell testability. | Alvin Jee, F. Joel Ferguson |
| 1993 | VTS | Carafe: an inductive fault analysis tool for CMOS VLSI circuits. | Alvin Jee, F. Joel Ferguson |