Andreas Glowatz
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
19
Venues
7
Active years
2006–2026
Best venue rank
A*
Where they publish
Papers
19 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | ETS | TDDB Stress Test Coverage Quantification using Cell-aware Transistor State Stress Model. | Vladimir A. Zivkovic, Stephan Eggersgl, Andreas Glowatz, Daniel Tille |
| 2025 | ETS | European Test Symposium Teams: an Anniversary Snapshot. | Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2024 | ITC | A Cell-aware Transistor State Stress Model and its Application for Quality Measurement. | Stephan Eggersgl, Andreas Glowatz |
| 2023 | ITC | Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes. | Saidapet Ramesh, Rahul Kalyan, Jesse Yanez, Andreas Glowatz, Maija Ryynnen, Sergej Schwarz |
| 2018 | ITC | DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. | Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski |
| 2014 | ETS | Cell-aware experiences in a high-quality automotive test suite. | Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenol Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski |
| 2013 | DDECS | Fault collapsing of multi-conditional faults. | Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke |
| 2012 | DDECS | A new SAT-based ATPG for generating highly compacted test sets. | Stephan Eggersgl, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler |
| 2012 | DSD | Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. | Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz |
| 2012 | ITC | Cell-aware Production test results from a 32-nm notebook processor. | Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jrgen Schlffel, Janusz Rajski |
| 2011 | ITC | Cell-aware analysis for small-delay effects and production test results from different fault models. | Friedrich Hapke, Jrgen Schlffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, J. Rearick, Jason Rivers |
| 2010 | ITC | Defect-oriented cell-internal testing. | Friedrich Hapke, Wilfried Redemund, Jrgen Schlffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger |
| 2009 | ITC | Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. | Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jrgen Schlffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson |
| 2009 | VTS | Restrict Encoding for Mixed-Mode BIST. | Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jrgen Schlffel, Friedrich Hapke, Andreas Glowatz |
| 2007 | ETS | Computation and Application of Absolute Dominators in Industrial Designs. | Rene Krenz-Baath, Andreas Glowatz, Jrgen Schlffel |
| 2007 | ITC | Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects. | Jeroen Geuzebroek, Erik Jan Marinissen, Ananta K. Majhi, Andreas Glowatz, Friedrich Hapke |
| 2007 | ITC | Programmable deterministic Built-In Self-Test. | Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jrgen Schlffel, Laurent Souef |
| 2007 | MEMOCODE | Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. | Stephan Eggersgl, Grschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jrgen Schlffel |
| 2006 | DAC | Fault detection and diagnosis with parity trees for space compaction of test responses. | Harald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jrgen Schlffel, Friedrich Hapke |