Andreas Leininger
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
9
Venues
4
Active years
2004–2016
Best venue rank
B
Where they publish
Papers
9 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2016 | DATE | Improving SRAM test quality by leveraging self-timed circuits. | Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian, Andreas Leininger |
| 2016 | VTS | Thermal issues in test: An overview of the significant aspects and industrial practice. | Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser |
| 2009 | ETS | Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment. | Frank-Uwe Faber, Matthias Beck, Markus Rudack, Olivier Barondeau, Thomas Rabenalt, Michael Gssel, Andreas Leininger |
| 2009 | ETS | Masking of X-values by Use of a Hierarchically Configurable Register. | Thomas Rabenalt, Michael Gssel, Andreas Leininger |
| 2008 | ETS | Accelerated Shift Registers for X-tolerant Test Data Compaction. | Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gssel |
| 2007 | ITC | Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques. | Andreas Leininger, Martin Fischer, Michael Richter, Michael Gssel |
| 2005 | ITC | Evaluating ATE-equipment for volume diagnosis. | Ralf Arnold, Andreas Leininger |
| 2005 | ITC | Compression mode diagnosis enables high volume monitoring diagnosis flow. | Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai |
| 2004 | DATE | Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code. | Andreas Leininger, Michael Gssel, Peter Muhmenthaler |