| 2026 | VTS | Innovative Practices Session: Recent Approaches in Dealing with Silent Data Corruption. | Harish Dattatraya Dixit, Arani Sinha, Nithya Jagannathan, David P. Lerner, Francesco Angione |
| 2026 | VTS | Late Breaking Results - Test Selection for In-Field Testing Using a Two-Dimensional Aging Space. | Irith Pomeranz, Subashini Gopalsamy, Arani Sinha, Yonsang Cho |
| 2025 | ITC | Efficient Delay Fault Characterization of Resistive Open Defects in Standard Cells Using Resistive Fault Dominance. | Gowsika Dharmaraj, Abhijit Chatterjee, Adit D. Singh, Arani Sinha |
| 2025 | VTS | Special Session: Trustworthy Hardware-AI at the Cloud. | Francesco Angione, Paolo Bernardi, Alberto Bosio, Harish Dattatraya Dixit, Salvatore Pappalardo, Annachiara Ruospo, Ernesto Snchez, Arani Sinha, Vittorio Turco |
| 2024 | ITC | Functional State Extraction using Scan DFT. | Ilya Wagner, Pankaj Pant, Arani Sinha |
| 2024 | VTS | Innovative Practices Track: Session 3 Test and Functional Safety Standards. | Arani Sinha |
| 2024 | VTS | Innovative Practices Track: Session 4 AI Applications in Test. | Arani Sinha, Stefano Di Carlo |
| 2024 | VTS | Innovative Practices Track: Session 2 Silent Data Corruption. | Arani Sinha, Adit D. Singh |
| 2023 | ITC | Maximizing Stress Coverage by Novel DFT Techniques and Relaxed Timing Closure. | Arani Sinha, Glenn Coln-Bonet, Michael Fahy, Pankaj Pant, Haijing Mao, Akhilesh Shukla |
| 2022 | ITC | Multi-die Parallel Test Fabric for Scalability and Pattern Reusability. | Arani Sinha, Yonsang Cho, Jon Easter, Meizel V. Leiva Rojas |
| 2022 | VTS | Innovative Practices Track: Silent Data Errors. | Arani Sinha |
| 2022 | VTS | Innovative Practices Track: Next Generation Test Standards. | Arani Sinha |
| 2021 | ETS | Synergies Between Delay Test and Post-silicon Speed Path Validation: A Tutorial Introduction. | Sandip Ray, Arani Sinha |
| 2021 | VTS | Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts. | Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee |
| 2020 | ITC | SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. | Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee |
| 2019 | DATE | Resynthesis for Avoiding Undetectable Faults Based on Design-for-Manufacturability Guidelines. | Naixing Wang, Irith Pomeranz, Sudhakar M. Reddy, Arani Sinha, Srikanth Venkataraman |
| 2019 | ITC | Characterization of Library Cells for Open-circuit Defect Exposure: A Systematic Methodology. | Sujay Pandey, Sanya Gupta, Madhu Sudhan L., Suriya Natarajan, Arani Sinha, Abhijit Chatterjee |
| 2019 | VTS | Silicon Proven Timing Signoff Methodology using Hazard-Free Robust Path Delay Tests. | Ankit Shah, Raman Nayyar, Arani Sinha |
| 2017 | ITC | DFM-aware fault model and ATPG for intra-cell and inter-cell defects. | Arani Sinha, Sujay Pandey, Ayush Singhal, Alodeep Sanyal, Alan Schmaltz |
| 2017 | VTS | Innovative practices session 1C screening for layout sensitive defects. | Arani Sinha, Nitin Chaudhary |
| 2013 | VTS | Path selection based on static timing analysis considering input necessary assignments. | Bo Yao, Arani Sinha, Irith Pomeranz |
| 2011 | VTS | A Novel mechanism for speed characterization during delay test. | Amitava Majumdar, Arani Sinha, Nehal Patel, Ramamurthy Setty, Yan Dong, Shu-Hsuan Chou |
| 2011 | VTS | The buck stops with wafer test: Dream or reality? | Suriyaprakash Natarajan, Arani Sinha |
| 2011 | VTS | The bang for the buck with resiliency: Yield or field? | Arani Sinha, Suriyaprakash Natarajan |
| 2010 | VTS | Special session 8C: Panel EDA for analog DFT/ATPG - will SoC cost pressures make this a reality? | Arani Sinha |
| 2009 | VTS | Panel: Analog Characterization and Test: The Long Road to Realization. | Arani Sinha, Amitava Majumdar, Vasu Ganti |
| 1999 | ICCAD | Validation and test generation for oscillatory noise in VLSI interconnects. | Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer |