Arun Gunda
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
9
Venues
5
Active years
1995–2012
Best venue rank
A
Where they publish
Papers
9 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2012 | VTS | Silicon evaluation of faster than at-speed transition delay tests. | Sreejit Chakravarty, Narendra Devta-Prasanna, Arun Gunda, Junxia Ma, Fan Yang, H. Guo, R. Lai, D. Li |
| 2010 | ITC | Clock Gate Test Points. | Narendra Devta-Prasanna, Arun Gunda |
| 2010 | ITC | Multiple fault activation cycle tests for transistor stuck-open faults. | Narendra Devta-Prasanna, Arun Gunda, Sudhakar M. Reddy, Irith Pomeranz |
| 2009 | ITC | Accurate measurement of small delay defect coverage of test patterns. | Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy |
| 2007 | ASPDAC | Systematic Scan Reconfiguration. | Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda |
| 2006 | ETS | A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
| 2005 | ICCD | A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals. | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
| 2005 | ITC | Methods for improving transition delay fault coverage using broadside tests. | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
| 1995 | ITC | Failure Analysis for Full-Scan Circuits. | Kaushik De, Arun Gunda |