| 2020 | HOTI | Bunch of Wires: An Open Die-to-Die Interface. | Shahab Ardalan, Halil Cirit, Ramin Farjad-Rad, Mark Kuemerle, Ken Poulton, Suresh Subramanian, Bapiraju Vinnakota |
| 2020 | HOTI | The Open Domain-Specific Architecture. | Kevin Drucker, Dharmesh Jani, Ishwar Agarwal, Gary Miller, Millind Mittal, Robert Wang, Bapiraju Vinnakota |
| 2019 | HOTI | A Bunch of Wires (BoW) Interface for Inter-Chiplet Communication. | Ramin Farjadrad, Bapiraju Vinnakota |
| 2019 | HOTI | High Capacity On-Package Physical Link Considerations. | Greg Taylor, Ramin Farjadrad, Bapiraju Vinnakota |
| 2004 | DAC | Combining dictionary coding and LFSR reseeding for test data compression. | Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota |
| 2003 | ITC | Test Vector Generation Based on Correlation Model for Ratio-Iddq. | Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota |
| 2003 | VTS | Development of Energy Consumption Ratio Test. | Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota |
| 2001 | ICCAD | Crosstalk Fault Detection by Dynamic Idd. | Xiaoyun Sun, Seonki Kim, Bapiraju Vinnakota |
| 2001 | ICCD | High Performance Parallel Fault Simulation. | Amit K. Varshney, Bapiraju Vinnakota, Eric Skuldt, Brion L. Keller |
| 2001 | ISCAS | Non-ideal amplifier effects on the accuracy of analog-to-digital capacitor ratio converter. | Wooyoung Choi, Ramesh Harjani, Bapiraju Vinnakota |
| 2001 | VTS | Current Measurement for Dynamic Idd Test. | Xiaoyun Sun, Bapiraju Vinnakota |
| 2000 | ICCAD | Fast Test Application Technique Without Fast Scan Clocks. | Seonki Kim, Bapiraju Vinnakota |
| 2000 | ITC | An analysis of the delay defect detection capability of the ECR test method. | Seonki Kim, Sreejit Chakravarty, Bapiraju Vinnakota |
| 2000 | VTS | Biomedical ICs: What is Different about Testing those ICs? | Bapiraju Vinnakota, Andr Ivanov |
| 1999 | DAC | Digital Aetection of Analog Parametric Faults in SC Filters. | Ramesh Harjani, Bapiraju Vinnakota |
| 1999 | DAC | IC Test Using the Energy Consumption Ratio. | Wanli Jiang, Bapiraju Vinnakota |
| 1999 | ICCAD | Deep submicron defect detection with the energy consumption ratio. | Bapiraju Vinnakota |
| 1999 | ITC | Statistical threshold formulation for dynamic I_dd test. | Wanli Jiang, Bapiraju Vinnakota |
| 1999 | VTS | Defect-Oriented Test Scheduling. | Wanli Jiang, Bapiraju Vinnakota |
| 1998 | DAC | Fast State Verification. | Dechang Sun, Bapiraju Vinnakota, Wanli Jiang |
| 1998 | ITC | Process-tolerant test with energy consumption ratio. | Bapiraju Vinnakota, Wanli Jiang, Dechang Sun |
| 1997 | VLSID | Pseudoduplication - An ACOB Technique for Single-Ended Circuits. | Bapiraju Vinnakota, Ramesh Harjani, Wooyoung Choi |
| 1996 | ICCAD | Zamlog: a parallel algorithm for fault simulation based on Zambezi. | Minesh B. Amin, Bapiraju Vinnakota |
| 1996 | VLSID | Mixed-Signal Design for Test. | Bapiraju Vinnakota, Ramesh Harjani |
| 1996 | VTS | ZAMBEZI: a parallel pattern parallel fault sequential circuit fault simulator. | Minesh B. Amin, Bapiraju Vinnakota |
| 1996 | VTS | Monitoring power dissipation for fault detection. | Bapiraju Vinnakota |
| 1995 | DAC | System-Level Design for Test of Fully Differential Analog Circuits. | Bapiraju Vinnakota, Ramesh Harjani, Nicholas J. Stessman |
| 1995 | ICCD | Data parallel fault simulation. | Minesh B. Amin, Bapiraju Vinnakota |
| 1995 | VTS | Reducing test application time in scan design schemes. | Bapiraju Vinnakota, Nicholas J. Stessman |
| 1994 | DAC | Functional Test Generation for FSMs by Fault Extraction. | Bapiraju Vinnakota, Jason Andrews |
| 1994 | VLSID | The Design of Analog Self-Checking Circuits. | Bapiraju Vinnakota, Ramesh Harjani |
| 1994 | VTS | Analog circuit observer blocks. | Ramesh Harjani, Bapiraju Vinnakota |
| 1993 | ICCD | A C-Testable Carry-Free Divider. | Hosahalli R. Srinivas, Bapiraju Vinnakota, Keshab K. Parhi |
| 1992 | ICCD | Repair of RAMs With Clustered Faults. | Bapiraju Vinnakota, Jason Andrews |