Baris Esen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
10
Venues
4
Active years
2014–2018
Best venue rank
A
Where they publish
Papers
10 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2018 | ISCAS | Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems. | Georges G. E. Gielen, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Nektar Xama |
| 2017 | ETS | A very low cost and highly parallel DfT method for analog and mixed-signal circuits. | Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2017 | ETS | Automatic testing of analog ICs for latent defects using topology modification. | Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2017 | ITC | Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. | Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2016 | ITC | Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis. | Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2016 | ITC | Analog fault coverage improvement using final-test dynamic part average testing. | Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges G. E. Gielen |
| 2016 | ITC | Effective DC fault models and testing approach for open defects in analog circuits. | Baris Esen, Anthony Coyette, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren |
| 2015 | ETS | Automatic generation of autonomous built-in observability structures for analog circuits. | Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen |
| 2015 | VTS | Automated testing of mixed-signal integrated circuits by topology modification. | Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen |
| 2014 | ITC | Design and test of analog circuits towards sub-ppm level. | Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Baris Esen |