Ben Niewenhuis
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
4
Active years
2013–2019
Best venue rank
A
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2019 | VTS | Path Delay Test of the Carnegie Mellon Logic Characterization Vehicle. | Ben Niewenhuis, Balaji Ravikumar, Zeye Liu, R. D. Shawn Blanton |
| 2017 | ETS | Multiple-defect diagnosis for Logic Characterization Vehicles. | Ben Niewenhuis, Soumya Mittal, R. D. (Shawn) Blanton |
| 2016 | DATE | Achieving 100% cell-aware coverage by design. | Zeye Liu, Ben Niewenhuis, Soumya Mittal, R. D. (Shawn) Blanton |
| 2016 | ITC | Test chip design for optimal cell-aware diagnosability. | Soumya Mittal, Zeye Liu, Ben Niewenhuis, R. D. (Shawn) Blanton |
| 2015 | VTS | Efficient built-in self test of regular logic characterization vehicles. | Ben Niewenhuis, Ronald D. Blanton |
| 2014 | ITC | Logic characterization vehicle design for maximal information extraction for yield learning. | Ronald D. Blanton, Ben Niewenhuis, Carl Taylor |
| 2013 | ITC | SCAN-PUF: A low overhead Physically Unclonable Function from scan chain power-up states. | Ben Niewenhuis, Ronald D. Blanton, Mudit Bhargava, Ken Mai |