| 2006 | VLSID | DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. | David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman |
| 2004 | ICCAD | Design/process learning from electrical test. | Bernd Koenemann |
| 2004 | ITC | Test In the Era of "What You see Is NOT What You Get". | Bernd Koenemann |
| 2002 | VTS | Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer? | Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark |
| 2001 | VTS | Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue. | Bill Bottoms, Jim Chung, Bernd Koenemann, Glenn Shirley, Lisa Spainhower |
| 1997 | VTS | ATE for VLSI: What Challenges Lie Ahead? | D. Cheung, Bernd Koenemann, S. Nishtala, B. West, D. Wu |
| 1996 | VTS | Design Validation: Formal Verification vs. Simulation vs. Functional Testing. | Bernd Koenemann, J. Monzel, T. Powell, N. Saxena, K. Wagner |
| 1996 | VTS | BIST: Advantages or Limitations? | Bernd Koenemann, J. Monzel, T. Powell, N. Saxena, K. Wagner |