| 2015 | VTS | No Fault Found: The root cause. | Erik Larsson, Bill Eklow, Scott Davidsson, Rob Aitken, Artur Jutman, Christophe Lotz |
| 2014 | ITC | A distributed, reconfigurable, and reusable bist infrastructure for 3D-stacked ICs. | Mukesh Agrawal, Krishnendu Chakrabarty, Bill Eklow |
| 2013 | DAC | On effective and efficient in-field TSV repair for stacked 3D ICs. | Li Jiang, Fangming Ye, Qiang Xu, Krishnendu Chakrabarty, Bill Eklow |
| 2012 | ASPDAC | Yield enhancement for 3D-stacked ICs: Recent advances and challenges. | Qiang Xu, Li Jiang, Huiyun Li, Bill Eklow |
| 2012 | DATE | On effective TSV repair for 3D-stacked ICs. | Li Jiang, Qiang Xu, Bill Eklow |
| 2012 | ETS | Re-using chip level DFT at board level. | Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson |
| 2012 | ITC | FALCON: Rapid statistical fault coverage estimation for complex designs. | Shahrzad Mirkhani, Jacob A. Abraham, Toai Vo, Hong Shin Jun, Bill Eklow |
| 2008 | ITC | Parametric Testing of Optical Interfaces. | Brice Achkir, Pavel Zivny, Bill Eklow |
| 2008 | ITC | Embedded Testing in an In-Circuit Test Environment. | John Malian, Bill Eklow |
| 2006 | ETS | New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). | Bill Eklow, Ben Bennetts |
| 2006 | ITC | IEEE P1687: Toward Standardized Access of Embedded Instrumentation. | Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote |
| 2006 | ITC | Test Economics - What can a Board/System Test Engineer do to Influence Supply Operation Metrics. | Sylvain Tourangeau, Bill Eklow |
| 2005 | ITC | A practical perspective on reducing ASIC NTFs. | Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow |
| 2005 | ITC | An update on IEEE 1149.6 - successes and issues. | Bill Eklow |
| 2005 | ITC | Optimized reasoning-based diagnosis for non-random, board-level, production defects. | Carlos O'Farrill, Merouane Moakil-Chbany, Bill Eklow |
| 2005 | ITC | IJTAG (internal JTAG): a step toward a DFT standard. | Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts |
| 2004 | DATE | IP Testing - The Future Differentiator? | Bill Eklow |
| 2004 | DATE | Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. | Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts |
| 2004 | ITC | What Do You Mean My Board Test Stinks? | Bill Eklow |
| 2004 | ITC | Simulation Based System Level Fault Insertion Using Co-verification Tools. | Bill Eklow, Anoosh Hosseini, Chi Khuong, Shyam Pullela, Toai Vo, Hien Chau |
| 2004 | ITC | Realizing High Test Quality Goals with Smart Test Resource Usage. | Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski |
| 2004 | ITC | "Real Life" System Testing of Networking Equipment. | Sunil Kalidindi, Nghia Huynh, Bill Eklow, Josh Goldstein |
| 2003 | ITC | IEEE 1149.6 - A Practical Perspective. | Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz |
| 2002 | ITC | Is Board Test Worth Talking About? | Bill Eklow |
| 2002 | ITC | IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. | Bill Eklow, Carl Barnhart, Kenneth P. Parker |