Brady Benware
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
23
Venues
3
Active years
2003–2014
Best venue rank
A
Where they publish
Papers
23 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2014 | VTS | Innovative practices session 2C: Advanced in yield learning. | Yen-Tzu Lin, Brady Benware, Brian Stine, Azeez Bhavnagarwala |
| 2013 | VTS | Distributed dynamic partitioning based diagnosis of scan chain. | Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy |
| 2012 | ITC | Improved volume diagnosis throughput using dynamic design partitioning. | Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware |
| 2011 | ETS | Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. | Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer |
| 2011 | ITC | A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores. | Manish Sharma, Avijit Dutta, Wu-Tung Cheng, Brady Benware, Mark Kassab |
| 2010 | ETS | Diagnosis of failing scan cells through orthogonal response compaction. | Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer |
| 2010 | ITC | Case study of scan chain diagnosis and PFA on a low yield wafer. | Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen |
| 2009 | VTS | Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. | Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware |
| 2008 | ITC | Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. | Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann |
| 2007 | ETS | Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. | Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware |
| 2007 | VTS | Silicon Evaluation of Static Alternative Fault Models. | Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware |
| 2006 | ITC | A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. | Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware |
| 2005 | ITC | Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC. | Joel Lurkins, DeAnna Hill, Brady Benware |
| 2005 | ITC | The value of statistical testing for quality, yield and test cost improvement. | Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch |
| 2005 | ITC | Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. | Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware |
| 2005 | VTS | Defect Screening Using Independent Component Analysis on I_DDQ. | Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch |
| 2004 | ITC | Achieving Sub 100 DPPM Defect Levels on VDSM and Nanometer ASICs. | Brady Benware |
| 2004 | ITC | Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. | Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski |
| 2004 | ITC | In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. | Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler |
| 2004 | VTS | Detection of Temperature Sensitive Defects Using ZTC. | Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware |
| 2003 | ITC | Impact of Multiple-Detect Test Patterns on Product Quality. | Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski |
| 2003 | ITC | Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. | Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning |
| 2003 | VTS | Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. | Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch |