| 2003 | IOLTS | Low-Cost On-Line Fault Detection Using Control Flow Assertions. | Rajesh Venkatasubramanian, John P. Hayes, Brian T. Murray |
| 2003 | SAFECOMP | Dependable Communication Synthesis for Distributed Embedded Systems. | Nagarajan Kandasamy, John P. Hayes, Brian T. Murray |
| 2002 | DSN | Time-Constrained Failure Diagnosis in Distributed Embedded Systems. | Nagarajan Kandasamy, John P. Hayes, Brian T. Murray |
| 1999 | VTS | Built-in Test Pattern Generation For High-Performance Cir cuits Using Twisted-Ring Counters. | Krishnendu Chakrabarty, Brian T. Murray, Vikram Iyengar |
| 1999 | SRDS | Tolerating Transient Faults in Statically Scheduled Safety-Critical Embedded Systems. | Nagarajan Kandasamy, John P. Hayes, Brian T. Murray |
| 1998 | VTS | Built-In Self Testing of Sequential Circuits Using Precomputed Test Sets. | Vikram Iyengar, Krishnendu Chakrabarty, Brian T. Murray |
| 1997 | ITC | Test Width Compression for Built-In Self Testing. | Krishnendu Chakrabarty, Jian Liu, Minyao Zhu, Brian T. Murray |
| 1995 | ITC | Optimal Space Compaction of Test Responses. | Krishnendu Chakrabarty, Brian T. Murray, John P. Hayes |
| 1991 | ITC | Test Propagation Through Modules and Circuits. | Brian T. Murray, John P. Hayes |
| 1988 | ITC | Hierarchical Test Generation Using Precomputed Tests for Modules. | Brian T. Murray, John P. Hayes |