| 2003 | ASPDAC | An automated method for test model generation from switch level circuits. | Tim McDougall, Atanas N. Parashkevov, Simon Jolly, Juhong Zhu, Jing Zeng, Carol Pyron, Magdy S. Abadir |
| 2002 | ITC | valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. | John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns |
| 2002 | ITC | Scan and BIST Can Almost Achieve Test Quality Levels. | Carol Pyron |
| 2002 | ITC | Silicon Symptoms to Solutions: Applying Design for Debug Techniques. | Carol Pyron, Rekha Bangalore, Dawit Belete, Jason Goertz, Ashutosh Razdan, Denise Younger |
| 2000 | VTS | At-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor. | Nandu Tendolkar, Robert F. Molyneaux, Carol Pyron, Rajesh Raina |
| 1999 | ITC | DFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor. | Carol Pyron, Mike Alexander, James Golab, George Joos, Bruce Long, Robert F. Molyneaux, Rajesh Raina, Nandu Tendolkar |
| 1997 | ITC | Next-Generation PowerPC | Carol Pyron, Javier Prado, James Golab |
| 1995 | ITC | Implementing 1149.1 in the PowerPC | Carol Pyron, William C. Bruce |
| 1992 | ITC | EDIF Test - The Upcoming Standard for Test Data Transfers. | Michael G. Wahl, Carol Pyron |
| 1991 | ITC | Representing Boundary Scan Tests with the EDIF Test View. | Carol Pyron |
| 1989 | ITC | CAE Functionality for Verification of Diagnostic Programs. | Carol Pyron, Rex Sallade |