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Chris Nigh

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

13

Venues

4

Active years

2020–2025

Best venue rank

A

Where they publish

Papers

13 indexed papers, newest first.

YearVenueTitleAuthors
2025ITCDebugging and Preventing Abnormally High Vmin during Logic Scan Test Bring-up.Min-Hsin Liu, Ding-Wei Cheng, James Chien-Mo Li, Chris Nigh, Szu Huat Goh, Mason Chern, Bing-Han Hsieh, Subhadip Kundu
2025ITCIC-PEPR: PEPR Testing Goes Intra-Cell.Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R. D. (Shawn) Blanton
2025VTSCHEF: CHaracterizing Elusive Logic Circuit Failures.Ruben Purdy, Chris Nigh, Wei Li, R. D. Shawn Blanton
2024ETSSilent Data Corruption: Test or Reliability Problem?Erik Jan Marinissen, Harish Dattatraya Dixit, Ronald Shawn Blanton, Aaron Kuo, Wei Li, Subhasish Mitra, Chris Nigh, Ruben Purdy, Ben Kaczer, Dishant Sangani, Pieter Weckx, Philippe J. Roussel, Georges G. E. Gielen
2024ETSFaulty Function Extraction for Defective Circuits.Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R. D. Shawn Blanton
2024VTSLogic-AAA: Debug of Logic Failures with an on-ATE Expert System.Chris Nigh, Ronald D. Blanton
2023ITCDiagnosis of Systematic Delay Failures Through Subset Relationship Analysis.Bing-Han Hsieh, Yun-Sheng Liu, James Chien-Mo Li, Chris Nigh, Mason Chern, Gaurav Bhargava
2022ITCDiagnosing Double Faulty Chains through Failing Bit Separation.Cheng-Sian Kuo, Bing-Han Hsieh, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava, Mason Chern
2022ITCPEPR: Pseudo-Exhaustive Physically-Aware Region Testing.Wei Li, Chris Nigh, Danielle Duvalsaint, Subhasish Mitra, Ronald D. Blanton
2021ITCAAA: Automated, On-ATE AI Debug of Scan Chain Failures.Chris Nigh, Gaurav Bhargava, Ronald D. Blanton
2021ITCImproving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization.Mu-Ting Wu, Cheng-Sian Kuo, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava
2020DATETest Pattern Superposition to Detect Hardware Trojans.Chris Nigh, Alex Orailoglu
2020VTSTaming Combinational Trojan Detection Challenges with Self-Referencing Adaptive Test Patterns.Chris Nigh, Alex Orailoglu