Constantinos Xanthopoulos
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
14
Venues
5
Active years
2014–2023
Best venue rank
A
Where they publish
Papers
14 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2023 | VTS | Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing. | V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, D. Webster, Amit Nahar, Yiorgos Makris |
| 2022 | ITC | Zero Trust Approach to IC Manufacturing and Testing. | Brian Buras, Constantinos Xanthopoulos, Ken Butler, Jason Kim |
| 2022 | ITC | Improvements in Automated IC Socket Pin Defect Detection. | Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao |
| 2021 | VTS | Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation. | V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, E. De La Rosa, C. Alleyne, S. Mier, Yiorgos Makris |
| 2020 | ITC | Automated Socket Anomaly Detection through Deep Learning. | Nidhi Agrawal, Min-Jian Yang, Constantinos Xanthopoulos, Vijayakumar Thangamariappan, Joe Xiao, Chee-Wah Ho, Keith Schaub, Ira Leventhal |
| 2019 | DATE | Wafer-Level Adaptive Vmin Calibration Seed Forecasting. | Constantinos Xanthopoulos, Deepika Neethirajan, Sirish Boddikurapati, Amit Nahar, Yiorgos Makris |
| 2019 | IOLTS | Automated Die Inking through On-line Machine Learning. | Constantinos Xanthopoulos, Arnold Neckermann, Paulus List, Klaus-Peter Tschernay, Peter Sarson, Yiorgos Makris |
| 2019 | ITC | Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion. | Kosuke Ikeda, Keith Schaub, Ira Leventhal, Yiorgos Makris, Constantinos Xanthopoulos, Deepika Neethirajan |
| 2019 | VTS | Machine Learning-based Noise Classification and Decomposition in RF Transceivers. | Deepika Neethirajan, Constantinos Xanthopoulos, Kiruba S. Subramani, Keith Schaub, Ira Leventhal, Yiorgos Makris |
| 2018 | VTS | Enhanced hotspot detection through synthetic pattern generation and design of experiments. | Gaurav Rajavendra Reddy, Constantinos Xanthopoulos, Yiorgos Makris |
| 2017 | ISCAS | Wafer-level adaptive trim seed forecasting based on E-tests. | Constantinos Xanthopoulos, Ali Ahmadi, Sirish Boddikurapati, Amit Nahar, Bob Orr, Yiorgos Makris |
| 2017 | ITC | Automated die inking: A pattern recognition-based approach. | Constantinos Xanthopoulos, Peter Sarson, Heinz Reiter, Yiorgos Makris |
| 2016 | ITC | Harnessing process variations for optimizing wafer-level probe-test flow. | Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2014 | ITC | IC laser trimming speed-up through wafer-level spatial correlation modeling. | Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris |