| 2011 | ITC | Test access and the testability features of the Poulson multi-core Intel Itanium processor. | Dilip K. Bhavsar, Steve Poehlman |
| 2011 | VTS | Harmony Widget for X-free scan testing. | Dilip K. Bhavsar |
| 2005 | VTS | A Built-in Self-Test Method for Write-only Content Addressable Memories. | Dilip K. Bhavsar |
| 2003 | ICCD | Automatic Generation of Critical-Path Tests for a Partial-Scan Microprocessor. | Joel Grodstein, Dilip K. Bhavsar, Vijay Bettada, Richard A. Davies |
| 2003 | ITC | Testability Features of the Alpha 21364 Microprocessor. | Scott Erlanger, Dilip K. Bhavsar, Richard A. Davies |
| 2002 | VTS | Scan Islands - A Scan Partitioning Architecture and its Implementation on the Alpha 21364 Processor. | Dilip K. Bhavsar, Richard A. Davies |
| 2001 | VLSID | Observability Register Architecture For Efficient Production Test And Debug Of Vlsi Circuits. | Dilip K. Bhavsar, Rishan Tan |
| 2001 | VTS | Scan Wheel - A Technique for Interfacing a High Speed Scan-Path with a Slow Speed Tester. | Dilip K. Bhavsar |
| 1999 | ITC | An algorithm for row-column self-repair of RAMs and its implementation in the Alpha 21264. | Dilip K. Bhavsar |
| 1998 | ITC | Testability access of the high speed test features in the Alpha 21264 microprocessor. | Dilip K. Bhavsar, David R. Akeson, Michael K. Gowan, Daniel B. Jackson |
| 1998 | ITC | A highly testable and diagnosable fabrication process test chip. | Dilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill |
| 1994 | ITC | Testability Strategy of the ALPHA AXP 21164 Microprocessor. | Dilip K. Bhavsar, John H. Edmondson |
| 1991 | ITC | An Architecture for Extending the IEEE Standard 1149.1 Test Access Port to System Backplanes. | Dilip K. Bhavsar |
| 1985 | ITC | "Concatenable Polydividers": Bit-Sliced LFSR Chips for Board Self-Test. | Dilip K. Bhavsar |
| 1984 | ITC | Can We Eliminate Fault Escape in Self-Testing by Polynomial Division (Signature Analysis) ? | Dilip K. Bhavsar, Balakrishnan Krishnamurthy |
| 1983 | DAC | Design For Test Calculus: An algorithm for DFT rules checking. | Dilip K. Bhavsar |
| 1981 | ITC | Self-Testing by Polynomial Division. | Dilip K. Bhavsar, Richard W. Heckelman |