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Elena I. Vatajelu

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

9

Venues

3

Active years

2010–2015

Best venue rank

B

Where they publish

Papers

9 indexed papers, newest first.

YearVenueTitleAuthors
2015DATERead/write robustness estimation metrics for spin transfer torque (STT) MRAM cell.Elena I. Vatajelu, Rosa Rodrguez-Montas, Marco Indaco, Michel Renovell, Paolo Prinetto, Joan Figueras
2015ETSPower-aware voltage tuning for STT-MRAM reliability.Elena I. Vatajelu, Rosa Rodrguez-Montas, Stefano Di Carlo, Marco Indaco, Michel Renovell, Paolo Prinetto, Joan Figueras
2014ETSOn the impact of process variability and aging on the reliability of emerging memories (Embedded tutorial).Marco Indaco, Paolo Prinetto, Elena I. Vatajelu
2013ETSAnalyzing resistive-open defects in SRAM core-cell under the effect of process variability.Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013IOLTSSRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations.Georgios Tsiligiannis, Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frdric Saign
2012DATEEfficiency evaluation of parametric failure mitigation techniques for reliable SRAM operation.Elena I. Vatajelu, Joan Figueras
2011DATERobustness analysis of 6T SRAMs in memory retention mode under PVT variations.Elena I. Vatajelu, Joan Figueras
2011IOLTSNew reliability mechanisms in memory design for sub-22nm technologies.Nivard Aymerich, A. Asenov, Andrew R. Brown, Ramon Canal, Binjie Cheng, Joan Figueras, Antonio Gonzlez, Enric Herrero, S. Markov, Miguel Miranda, Peyman Pouyan, Tanaus Ramrez, Antonio Rubio, Elena I. Vatajelu, Xavier Vera, Xingsheng Wang, Paul Zuber
2010ETSParametric failure analysis of embedded SRAMs using fast & accurate dynamic analysis.Elena I. Vatajelu, Georgios Panagopoulos, Kaushik Roy, Joan Figueras