| 2008 | ETS | Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design. | Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans G. M. de Jong |
| 2007 | ITC | SiP-test: Predicting delivery quality. | Alex S. Biewenga, Frans G. M. de Jong |
| 2006 | ITC | SiP-TAP: JTAG for SiP. | Frans G. M. de Jong, Alex S. Biewenga |
| 2003 | ITC | IEEE P1581: To Live or Let die? | Frans G. M. de Jong, Leon van de Logt |
| 2003 | ITC | Board Test Coverage: The Value of Prediction and How to Compare Numbers. | Wouter Rijckaert, Frans G. M. de Jong |
| 2002 | VTS | Improved Test Monitor Circuit in Power Pin DfT. | Rodger Schuttert, Frans G. M. de Jong, Ben Kup |
| 2001 | ETS | System-level DFT for consumer products. | D. C. L. (Erik) van Geest, Frans G. M. de Jong |
| 2001 | ITC | Testing and programming flash memories on assemblies during high volume production. | Frans G. M. de Jong, Alex S. Biewenga, D. C. L. (Erik) van Geest, T. F. Waayers |
| 2000 | ITC | Power pin testing: making the test coverage complete. | Frans G. M. de Jong, Ben Kup, Rodger Schuttert |
| 1999 | ITC | Static component interconnect test technology (SCITT) a new technology for assembly testing. | Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg |
| 1999 | ITC | SCITT: Back to Basics in Mass Production Testing. | Frans G. M. de Jong |
| 1999 | ITC | Static component interconnection test technology in practice. | Frans G. M. de Jong, Rob Raaijmakers |
| 1992 | ITC | Memory Interconnection Test at Board Level. | Frans G. M. de Jong, Adriaan J. de Lind van Wijngaarden |
| 1991 | ITC | Testing the Integrity of the Boundary Scan Test Infrastructure. | Frans G. M. de Jong, Frank van der Heyden |
| 1990 | ITC | Boundary scan test used at board level: moving towards reality. | Frans G. M. de Jong |