Friedrich Hapke
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
24
Venues
8
Active years
2003–2018
Best venue rank
A*
Where they publish
Papers
24 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2018 | ITC | Total Critical Area Based Testing. | Friedrich Hapke, Peter C. Maxwell |
| 2018 | ITC | DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. | Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski |
| 2017 | ETS | Bridge over troubled waters: Critical area based pattern generation. | Peter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh |
| 2016 | ETS | Cell-aware diagnosis: Defective inmates exposed in their cells. | Peter C. Maxwell, Friedrich Hapke, Huaxing Tang |
| 2015 | ITC | Embedded deterministic test points for compact cell-aware tests. | Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada |
| 2014 | ETS | Cell-aware experiences in a high-quality automotive test suite. | Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenol Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski |
| 2013 | DDECS | Fault collapsing of multi-conditional faults. | Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke |
| 2013 | DSD | Industrial Application of IEEE P1687 for an Automotive Product. | Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath |
| 2012 | DATE | EDA solutions to new-defect detection in advanced process technologies. | Erik Jan Marinissen, Gilbert Vandling, Sandeep Kumar Goel, Friedrich Hapke, Jason Rivers, Nikolaus Mittermaier, Swapnil Bahl |
| 2012 | DDECS | A new SAT-based ATPG for generating highly compacted test sets. | Stephan Eggersgl, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler |
| 2012 | DSD | Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. | Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz |
| 2012 | ETS | Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates. | Friedrich Hapke, Jrgen Schlffel |
| 2012 | ITC | Cell-aware Production test results from a 32-nm notebook processor. | Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jrgen Schlffel, Janusz Rajski |
| 2011 | ITC | Cell-aware analysis for small-delay effects and production test results from different fault models. | Friedrich Hapke, Jrgen Schlffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, J. Rearick, Jason Rivers |
| 2010 | ITC | Defect-oriented cell-internal testing. | Friedrich Hapke, Wilfried Redemund, Jrgen Schlffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger |
| 2009 | ITC | Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. | Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jrgen Schlffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson |
| 2009 | VTS | Restrict Encoding for Mixed-Mode BIST. | Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jrgen Schlffel, Friedrich Hapke, Andreas Glowatz |
| 2007 | ITC | Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects. | Jeroen Geuzebroek, Erik Jan Marinissen, Ananta K. Majhi, Andreas Glowatz, Friedrich Hapke |
| 2007 | ITC | Programmable deterministic Built-In Self-Test. | Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jrgen Schlffel, Laurent Souef |
| 2007 | MEMOCODE | Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. | Stephan Eggersgl, Grschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jrgen Schlffel |
| 2006 | DAC | Fault detection and diagnosis with parity trees for space compaction of test responses. | Harald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jrgen Schlffel, Friedrich Hapke |
| 2004 | ITC | Efficient Pattern Mapping for Deterministic Logic BIST. | Valentin Gherman, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Michael Garbers |
| 2004 | ITC | X-Masking During Logic BIST and Its Impact on Defect Coverage. | Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker |
| 2003 | ITC | ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. | Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink |