| 2014 | VTS | Development and empirical verification of an accuracy model for the power down leakage tests. | Jae Woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao |
| 2013 | VLSID | Physics Based Fault Models for Testing High-Voltage LDMOS. | Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Friedrich Taenzler, Richard Antley, Ken Moushegian |
| 2010 | VTS | Low cost test and tuning of RF circuits and systems. | Abhijit Chatterjee, Friedrich Taenzler |
| 2008 | ITC | Optimized EVM Testing for IEEE 802.11a/n RF ICs. | Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler |
| 2008 | ITC | Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms. | Ganesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler |
| 2006 | DATE | Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms. | Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee |
| 2006 | VTS | Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. | Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler |
| 1993 | VTS | Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing. | Friedrich Taenzler, Thomas Novak, Erich Kubalek |