Guido Gronthoud
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
18
Venues
4
Active years
2000–2009
Best venue rank
A
Where they publish
Papers
18 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | ETS | Algorithms for ADC Multi-site Test with Digital Input Stimulus. | Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud |
| 2008 | ETS | Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design. | Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans G. M. de Jong |
| 2007 | DATE | Re-configuration of sub-blocks for effective application of time domain tests. | Jens Anders, Shaji Krishnan, Guido Gronthoud |
| 2007 | VTS | On Performance Testing with Path Delay Patterns. | Bram Kruseman, Ananta K. Majhi, Guido Gronthoud |
| 2006 | ITC | Power Supply Noise in Delay Testing. | Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger |
| 2006 | VTS | A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis. | Xinyue Fan, Will R. Moore, Camelia Hora, Mario Konijnenburg, Guido Gronthoud |
| 2005 | DATE | Memory Testing Under Different Stress Conditions: An Industrial Evaluation. | Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen |
| 2005 | ETS | Stuck-open fault diagnosis with stuck-at model. | Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud |
| 2005 | ITC | A novel stuck-at based method for transistor stuck-open fault diagnosis. | Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud |
| 2005 | ITC | Functional vs. multi-VDD testing of RF circuits. | Estella Silva, Jos Pineda de Gyvez, Guido Gronthoud |
| 2005 | VTS | A New Algorithm for Dynamic Faults Detection in RAMs. | Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg |
| 2004 | ITC | Power Supply Ramping for Quasi-static Testing of PLLs. | Jos Pineda de Gyvez, Guido Gronthoud, Cristiano Cenci, Martin Posch, Thomas Burger, Manfred Koller |
| 2004 | ITC | On Hazard-free Patterns for Fine-delay Fault Testing. | Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger |
| 2003 | ETS | Process-variability aware delay fault testing of ΔV | Daniel Arum-Delgado, Rosa Rodrguez-Montas, Jos Pineda de Gyvez, Guido Gronthoud |
| 2003 | ITC | VDD Ramp Testing for RF Circuits. | Jos Pineda de Gyvez, Guido Gronthoud, Rashid Amine |
| 2003 | VTS | Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. | Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger |
| 2001 | ETS | Reducing analogue fault-simulation time by using high-level modelling in dotss for an industrial design. | Liquan Fang, Guido Gronthoud, Hans G. Kerkhoff |
| 2000 | ITC | Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? | Will R. Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg |