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Hans Martin von Staudt

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

13

Venues

5

Active years

2006–2025

Best venue rank

A

Where they publish

Papers

13 indexed papers, newest first.

YearVenueTitleAuthors
2025ITCMaking IJTAG Address Physical-World Digital and Mixed-Signal Test Challenges.Hans Martin von Staudt, Jeff Rearick, Michael Laisne
2022ITCIEEE P1687.1: Extending the Network Boundaries for Test.Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo
2022ITCProbeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC.Hans Martin von Staudt, Luai Tarek Elnawawy, Sarah Wang, Larry Ping, Jung Woo Choi
2022ITCHigh-Coverage DfT and Reliability Enhancements for Automotive Floating Gate OTP Beyond AEC-Q100.Hans Martin von Staudt, Franz Schuler, Rohitaswa Bhattacharya, Justin Wei-Lin Cheng, Cheng-Da Huang, Parker Chih-Chun Chen
2021ETSExploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces.Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim
2020ITCModeling Novel Non-JTAG IEEE 1687-Like Architectures.Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick
2020ITCIndustrial Application of IJTAG Standards to the Test of Big-A/little-d devices.Hans Martin von Staudt, Mohamed Anas Benhebibi, Jeff Rearick, Michael Laisne
2019VTSInnovative Practices on IEEE 1687.xyz.Jeff Rearick, Alfred L. Crouch, Hans Martin von Staudt
2019VTSInnovative Design for Test in State-of-the-Art Analog Systems.Hans Martin von Staudt, Amit Majumdar, Bill Taylor, Jennifer Kitchen
2017ITCSingle-pin test control for Big A, little D devices.Michael Laisne, Hans Martin von Staudt, Sourabh Bhalerao, Mark Eason
2007DATEA sophisticated memory test engine for LCD display drivers.Oliver Spang, Hans Martin von Staudt, Michael G. Wahl
2006DDECSProductivity and Code Quality Improvement of Mixed-Signal Test Software by Applying Software Engineering Methods.Stefan Vock, Ulrich Flogaus, Hans Martin von Staudt
2006ITCTest Software Generation Productivity and Code Quality Improvement by applying Software Engineering Techniques.Stefan Vock, Markus Schmid, Hans Martin von Staudt