| 2025 | ITC | A Probabilistic Approach of Fault Propagation at RTL and its Application to Transient Fault Analysis. | Chien-Hsing Liang, Yu-Hong Chao, Jing-Jia Liou, Harry H. Chen |
| 2025 | VTS | Multi-core Vmin and Worst-core Vmin Prediction using SOMAC. | Jeng-Yu Liao, Li-Yang Wang, James Chien-Mo Li, Harry H. Chen |
| 2023 | VTS | Vmin Prediction Using Nondestructive Stress Test. | Chun Chen, Jeng-Yu Liao, James Chien-Mo Li, Harry H. Chen, Eric Jia-Wei Fang |
| 2022 | ITC | Transient Fault Pruning for Effective Candidate Reduction in Functional Debugging. | Dun-An Yang, Jing-Jia Liou, Harry H. Chen |
| 2021 | ITC | ACE-Pro: Reduction of Functional Errors with ACE Propagation Graph. | Dun-An Yang, Yu-Teng Chang, Ting-Shuo Hsu, Jing-Jia Liou, Harry H. Chen |
| 2020 | VTS | Innovative Test Practices in Asia. | Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Yukiya Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi, Kazumi Hatayama |
| 2019 | DATE | Hardware and firmware verification and validation: an algorithm-to-firmware development methodology. | Henry Cox, Harry H. Chen |
| 2018 | ETS | Covering hard-to-detect defects by thermal quorum sensing. | Po-Yao Chuang, Cheng-Wen Wu, Harry H. Chen |
| 2015 | VTS | Statistical techniques for predicting system-level failure using stress-test data. | Harry H. Chen, Shih-Hua Kuo, Jonathan Tung, Mango Chia-Tso Chao |
| 2014 | ITC | The case for analyzing system level failures using structural patterns. | Harry H. Chen |
| 2013 | ITC | Predicting system-level test and in-field customer failures using data mining. | Harry H. Chen, Roger Hsu, PaulYoung Yang, J. J. Shyr |
| 1985 | ITC | An Algorithm to Generate Tests for MOS Circuits at the Switch Level. | Harry H. Chen, Robert G. Mathews, John A. Newkirk |
| 1984 | ITC | Test Generation for MOS Circuits. | Harry H. Chen, Robert G. Mathews, John A. Newkirk |