| 2006 | ITC | Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues. | Ismet Bayraktaroglu, Jim Hunt, Daniel Watkins |
| 2005 | ITC | Microprocessor silicon debug based on failure propagation tracing. | Olivier Caty, Peter Dahlgren, Ismet Bayraktaroglu |
| 2005 | VTS | Highly Configurable Programmable Built-In Self Test Architecture for High-Speed Memories. | Ismet Bayraktaroglu, Olivier Caty, Yickkei Wong |
| 2003 | DAC | Test application time and volume compression through seed overlapping. | Wenjing Rao, Ismet Bayraktaroglu, Alex Orailoglu |
| 2003 | ITC | Instruction Based BIST for Board/System Level Test of External Memories and Internconnects. | Olivier Caty, Ismet Bayraktaroglu, Amitava Majumdar, Richard Lee, John Bell, Lisa Curhan |
| 2003 | VTS | Decompression Hardware Determination for Test Volume and Time Reduction through Unified Test Pattern Compaction and Compression. | Ismet Bayraktaroglu, Alex Orailoglu |
| 2002 | DATE | Gate Level Fault Diagnosis in Scan-Based BIST. | Ismet Bayraktaroglu, Alex Orailoglu |
| 2002 | ETS | Dynamic test data transformations for average and peak power reductions. | Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu |
| 2002 | ITC | Scan Power Reduction Through Test Data Transition Frequency Analysis. | Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu |
| 2002 | VTS | Test Power Reduction through Minimization of Scan Chain Transitions. | Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu |
| 2001 | DAC | Test Volume and Application Time Reduction Through Scan Chain Concealment. | Ismet Bayraktaroglu, Alex Orailoglu |
| 2001 | DATE | Diagnosis for scan-based BIST: reaching deep into the signatures. | Ismet Bayraktaroglu, Alex Orailoglu |
| 2000 | DAC | Improved fault diagnosis in scan-based BIST via superposition. | Ismet Bayraktaroglu, Alex Orailoglu |
| 2000 | DATE | Test Synthesis for Mixed-Signal SOC Paths. | Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu |
| 2000 | ETS | Low cost concurrent test implementation for linear digital systems. | Ismet Bayraktaroglu, Alex Orailoglu |
| 2000 | ICASSP | Cost effective digital filter design for concurrent test. | Ismet Bayraktaroglu, Alex Orailoglu |
| 2000 | ISCAS | Unifying methodologies for high fault coverage concurrent and off-line test of digital filters. | Ismet Bayraktaroglu, Alex Orailoglu |
| 2000 | ITC | Deterministic partitioning techniques for fault diagnosis in scan-based BIST. | Ismet Bayraktaroglu, Alex Orailoglu |
| 2000 | VTS | Invariance-Based On-Line Test for RTL Controller-Datapath Circuits. | Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu |
| 1999 | VTS | Low-Cost On-Line Test for Digital Filters. | Ismet Bayraktaroglu, Alex Orailoglu |