| 2024 | VLSID | Revisiting Test Compression Configuration in Context of Multi-Core Testing Using Packetized Scan Network. | Subhadip Kundu, Jais Abraham |
| 2022 | ITC | Low Capture Power At-Speed Test with Local Hot Spot Analysis to Reduce Over-Test. | Ankush Srivastava, Jais Abraham |
| 2016 | VLSID | Test Time Minimisation in Scan Compression Designs Using Dynamic Channel Allocation. | Jais Abraham, Shankar Umapathi, Sumitha Krishnamurthi |
| 2007 | VLSID | Enhancements in Deterministic BIST Implementations for Improving Test of Complex SOCs. | Sandeep Jain, Jais Abraham, Srinivas Kumar Vooka, Sumant Kale, Amit Dutta, Rubin A. Parekhji |
| 2006 | VTS | Multi-Cycle Sensitizable Transition Delay Faults. | Jais Abraham, Uday Goel, Arun Kumar |
| 2002 | VLSID | Challenges in the Design of a Scalable Data-Acquisition and Processing System-on-Silicon. | Karanth Shankaranarayana, Soujanna Sarkar, R. Venkatraman, Shyam S. Jagini, N. Venkatesh, Jagdish C. Rao, H. Udayakumar, M. Sambandam, K. P. Sheshadri, S. Talapatra, Parag Mhatre, Jais Abraham, Rubin A. Parekhji |
| 2000 | ITC | A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx. | Jais Abraham, Narayan Prasad, Srinivasa Chakravarthy B. S., Ameet Bagwe, Rubin A. Parekhji |