Jakub Janicki
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
10
Venues
2
Active years
2010–2025
Best venue rank
A
Where they publish
Papers
10 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | ITC | Using Distinguishing Bits to Improve Chain Diagnosis Coverage for Silicon Defects. | Wu-Tung Cheng, Manish Sharma, Artur Stelmach, Jakub Janicki, Preston McWithey, Gaurav Veda, Szczepan Urban, Jayant D'Souza |
| 2025 | ITC | Chain Cell-Aware Diagnosis. | Szczepan Urban, Jakub Janicki, Piotr Zimnowlodzki, Artur Stelmach, Manish Sharma |
| 2024 | ITC | Adaptive Diagnosis Points for 100% Chain Diagnosis Coverage. | Wu-Tung Cheng, Manish Sharma, Xin Yang, Artur Stelmach, Szczepan Urban, Jakub Janicki, Preston McWithey |
| 2023 | ITC | Predicting the Resolution of Scan Diagnosis. | Manoj Devendhiran, Jakub Janicki, Szczepan Urban, Manish Sharma, Jayant D'Souza |
| 2022 | ITC | Industry Evaluation of Reversible Scan Chain Diagnosis. | Soumya Mittal, Szczepan Urban, Kun Young Chung, Jakub Janicki, Wu-Tung Cheng, Martin Parley, Manish Sharma, Shaun Nicholson |
| 2019 | ETS | Non-Adaptive Pattern Reordering to Improve Scan Chain Diagnostic Resolution. | Yu Huang, Jakub Janicki, Szczepan Urban |
| 2013 | ITC | EDT bandwidth management - Practical scenarios for large SoC designs. | Jakub Janicki, Jerzy Tyszer, Wu-Tung Cheng, Yu Huang, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski, Yan Dong, Grady Giles |
| 2012 | ETS | Bandwidth-aware test compression logic for SoC designs. | Jakub Janicki, Jerzy Tyszer, Grzegorz Mrugalski, Janusz Rajski |
| 2011 | ITC | EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism. | Jakub Janicki, Jerzy Tyszer, Avijit Dutta, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski |
| 2010 | ITC | Dynamic channel allocation for higher EDT compression in SoC designs. | Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jakub Janicki, Jerzy Tyszer |