Jean Michel Daga
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
10
Venues
5
Active years
1997–2008
Best venue rank
A
Where they publish
Papers
10 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2008 | ETS | Hierarchical Code Correction and Reliability Management in Embedded nor Flash Memories. | Benot Godard, Jean Michel Daga, Lionel Torres, Gilles Sassatelli |
| 2007 | DATE | Evaluation of design for reliability techniques in embedded flash memories. | Benot Godard, Jean Michel Daga, Lionel Torres, Gilles Sassatelli |
| 2007 | DDECS | Architecture for Highly Reliable Embedded Flash Memories. | Benot Godard, Jean Michel Daga, Lionel Torres, Gilles Sassatelli |
| 2007 | ETS | Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories. | Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2007 | ITC | A concurrent approach for testing address decoder faults in eFlash memories. | Olivier Ginez, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Jean Michel Daga |
| 2007 | VTS | Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window. | Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2006 | VTS | An Overview of Failure Mechanisms in Embedded Flash Memories. | Olivier Ginez, Jean Michel Daga, Marylene Combe, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2002 | ITC | Test and Repair of Embedded Flash Memories. | Jean Michel Daga |
| 1998 | DATE | Temperature Effect on Delay for Low Voltage Applications. | Jean Michel Daga, E. Ottaviano, Daniel Auvergne |
| 1997 | DATE | Internal power modelling and minimization in CMOS inverters. | S. Turgis, Jean Michel Daga, Josep M. Portal, Daniel Auvergne |