John M. Carulli Jr.
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
15
Venues
5
Active years
2005–2016
Best venue rank
A
Where they publish
Papers
15 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2016 | ITC | Variation and failure characterization through pattern classification of test data from multiple test stages. | Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng |
| 2015 | DATE | A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits. | Hugo R. Gonalves, Xin Li, Miguel V. Correia, Vtor Tavares, John M. Carulli Jr., Kenneth M. Butler |
| 2014 | ITC | Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation. | Ali Ahmadi, Ke Huang, Suriyaprakash Natarajan, John M. Carulli Jr., Yiorgos Makris |
| 2014 | ITC | IC laser trimming speed-up through wafer-level spatial correlation modeling. | Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris |
| 2014 | ITC | Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. | Shanghang Zhang, Xin Li, Ronald D. Blanton, Jos Machado da Silva, John M. Carulli Jr., Kenneth M. Butler |
| 2013 | DATE | Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests. | Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris |
| 2013 | ETS | On combining alternate test with spatial correlation modeling in analog/RF ICs. | Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris |
| 2013 | ITC | Process monitoring through wafer-level spatial variation decomposition. | Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris |
| 2012 | ICCAD | Spatial correlation modeling for probe test cost reduction in RF devices. | Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris |
| 2012 | ITC | Spatial estimation of wafer measurement parameters using Gaussian process models. | Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris |
| 2011 | ITC | Die-level adaptive test: Real-time test reordering and elimination. | Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar |
| 2010 | DATE | Adapting to adaptive testing. | Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli |
| 2009 | ICCD | Quality improvement and cost reduction using statistical outlier methods. | Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger |
| 2008 | ITC | Modeling Test Escape Rate as a Function of Multiple Coverages. | Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena |
| 2005 | ITC | Test connections - tying application to process. | John M. Carulli Jr., Thomas J. Anderson |