Jongsin Yun
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
15
Venues
4
Active years
2020–2026
Best venue rank
B
Where they publish
Papers
15 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | ETS | Reliability, Test, and Security of Compute-In-Memories. | Soyed Tuhin Ahmed, Krishnendu Chakrabarty, Jin-Fu Li, Mottaqiallah Taouil, Fouwad Jamil Mir, Said Hamdioui, Mehdi B. Tahoori, Martin Keim, Jongsin Yun |
| 2026 | ETS | Memory ECC Logic Testing using MBIST. | Wei Zou, Artur Pogiel, Martin Keim, Albert Au, Jongsin Yun, Luc Romain |
| 2025 | ETS | A Novel BIST Method for Multi-Port Register Files. | Andy Chen, Vianney Choserot, Munish Kumar, Khushal Gelda, Shreyas Pramod Dixit, Wei Zou, Jongsin Yun, Harshitha Kodali, Albert Au, Lori Schramm, Martin Keim |
| 2025 | ETS | MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in Memory. | Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori |
| 2025 | ETS | Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance. | Vinayak Bharat Naik, Gregory Billus, Amit Kumar Shukla, Andre Vogel, Veit Kriegerstein, Patrick Scharf, Venkata Siva Komma, Johannes Mueller, Thomas Merbeth, Ralf Flemming, Ingolf Lorenz, Muthu Kumaran Nambi, Ee Ee Yeoh, Hemavathi Chaya, Siddharth Gupta, Yentsai Huang, Sushma Sambatur, Joerg Winkler, Tom Andre, Shane Hollmer, Steven Soss, Jongsin Yun, Wei Zou, Harshitha Kodali, Luc Romain, Albert Au, Lori Schramm, Martin Keim |
| 2024 | ETS | MBIST-based weak bit screening method for embedded MRAM. | Jongsin Yun, Sina Bakhtavari Mamaghani, Mehdi B. Tahoori, Christopher Mnch, Martin Keim |
| 2024 | ITC | Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies. | Jaehoon Lee, Hyeonuk Son, Seohyun Kang, Dahyun Kang, Dongkwan Han, Jongsin Yun, Artur Pogiel, Etienne Racine, Krzysztof Jurga, Lori Schramm, Martin Keim |
| 2024 | ITC | MBIST-based MRAM defect screening for safety-critical applications. | Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
| 2024 | VTS | Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM. | Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
| 2023 | DATE | Smart Hammering: A practical method of pinhole detection in MRAM memories. | Sina Bakhtavari Mamaghani, Christopher Mnch, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori |
| 2023 | ITC | Transitioning eMRAM from Pilot Project to Volume Production. | Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim |
| 2022 | VTS | MBIST-based Trim-Search Test Time Reduction for STT-MRAM. | Christopher Mnch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
| 2021 | ETS | MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM. | Christopher Mnch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
| 2020 | ETS | MBIST Support for Reliable eMRAM Sensing. | Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Cyrille Dray, El Mehdi Boujamaa |
| 2020 | ITC | MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. | Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda |