Joonsung Park
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
5
Venues
3
Active years
2006–2019
Best venue rank
B
Where they publish
Papers
5 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2019 | ETS | Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. | Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev |
| 2010 | VTS | Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. | Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo |
| 2009 | ETS | Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. | Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh |
| 2008 | VTS | Parallel Loopback Test of Mixed-Signal Circuits. | Joonsung Park, Hongjoong Shin, Jacob A. Abraham |
| 2006 | ITC | Built-in Fault Diagnosis for Tunable Analog Systems Using an Ensemble Method. | Hongjoong Shin, Joonsung Park, Jacob A. Abraham |