| 2011 | DATE | Feedback based droop mitigation. | Salvatore Pontarelli, Marco Ottavi, Adelio Salsano, Kamran Zarrineh |
| 2005 | ITC | Design and analysis of multiple weight linear compactors of responses containing unknown values. | Thomas Clouqueur, Kamran Zarrineh, Kewal K. Saluja, Hideo Fujiwara |
| 2003 | ITC | The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. | Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh, Pradipta Ghosh, Scott Davidson, Peter Harrod |
| 2001 | ICCD | Automatic Generation and Validation of Memory Test Models for High Performance Microprocessors. | Kamran Zarrineh, Thomas A. Ziaja, Amitava Majumdar |
| 2000 | ITC | Self test architecture for testing complex memory structures. | Kamran Zarrineh, R. Dean Adams, Thomas J. Eckenrode, Steven P. Gregor |
| 1999 | DATE | On Programmable Memory Built-In Self Test Architectures. | Kamran Zarrineh, Shambhu J. Upadhyaya |
| 1999 | ISCAS | A design for test perspective on memory synthesis. | Kamran Zarrineh, Shambhu J. Upadhyaya |
| 1999 | VTS | A New Framework For Automatic Generation, Insertion and Verification of Memory Built-In Self Test Units. | Kamran Zarrineh, Shambhu J. Upadhyaya |
| 1998 | ITC | A new framework for generating optimal March tests for memory arrays. | Kamran Zarrineh, Shambhu J. Upadhyaya, Sreejit Chakravarty |
| 1998 | VTS | Automatic Insertion of Scan Structures to Enhance Testability of Embedded Memories, Cores and Chips. | Kamran Zarrineh, Shambhu J. Upadhyaya, Philip Shephard III |
| 1997 | ITC | Addressing Early Design-For-Test Synthesis in a Production Environment. | Vivek Chickermane, Kamran Zarrineh |
| 1996 | ICCD | A Design For Test Perspective on I/O Management. | Kamran Zarrineh, Vivek Chickermane, Gareth Nicholls, Mike Palmer |