M. Enamul Amyeen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
20
Venues
3
Active years
1999–2017
Best venue rank
National
Where they publish
Papers
20 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2017 | ITC | Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure. | Srikanth Venkataraman, Irith Pomeranz, Shraddha Bodhe, M. Enamul Amyeen |
| 2016 | ITC | A novel diagnostic test generation methodology and its application in production failure isolation. | M. Enamul Amyeen, Dongok Kim, Maheshwar Chandrasekar, Mohammad Noman, Srikanth Venkataraman, Anurag Jain, Neha Goel, Ramesh Sharma |
| 2016 | ITC | Diagnostic resolution improvement through learning-guided physical failure analysis. | Carlston Lim, Yang Xue, Xin Li, Ronald D. Blanton, M. Enamul Amyeen |
| 2016 | VTS | Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm. | Shraddha Bodhe, M. Enamul Amyeen, Clariza Galendez, Houston Mooers, Irith Pomeranz, Srikanth Venkataraman |
| 2015 | VTS | Innovative practices session 5C: Advancements in test -keeping moore moving! | M. Enamul Amyeen |
| 2011 | ITC | Logic BIST silicon debug and volume diagnosis methodology. | M. Enamul Amyeen, Andal Jayalakshmi, Srikanth Venkataraman, Sundar V. Pathy, Ewe C. Tan |
| 2010 | VTS | Defect diagnosis based on DFM guidelines. | Dongok Kim, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman |
| 2009 | ITC | Microprocessor system failures debug and fault isolation methodology. | M. Enamul Amyeen, Srikanth Venkataraman, Mun Wai Mak |
| 2007 | ITC | Testing for systematic defects based on DFM guidelines. | Dongok Kim, M. Enamul Amyeen, Srikanth Venkataraman, Irith Pomeranz, Swagato Basumallick, Berni Landau |
| 2007 | VTS | Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. | Vishnu C. Vimjam, M. Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang |
| 2006 | ITC | Improving Precision Using Mixed-level Fault Diagnosis. | M. Enamul Amyeen, Debashis Nayak, Srikanth Venkataraman |
| 2006 | VTS | Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. | Ruifeng Guo, Subhasish Mitra, M. Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman |
| 2006 | VTS | Dominance Based Analysis for Large Volume Production Fail Diagnosis. | Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen, Sudhakar M. Reddy |
| 2004 | ITC | Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. | M. Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee |
| 2004 | VLSID | Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. | Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, M. Enamul Amyeen |
| 2004 | VTS | An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. | Srikanth Venkataraman, Srihari Sivaraj, M. Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo |
| 2003 | VTS | Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. | Xiaoming Yu, M. Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz |
| 2002 | VTS | Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits. | M. Enamul Amyeen, Irith Pomeranz, W. Kent Fuchs |
| 2001 | VTS | Fault Equivalence Identification Using Redundancy Information and Static and Dynamic Extraction. | M. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana |
| 1999 | VTS | Implication and Evaluation Techniques for Proving Fault Equivalence. | M. Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana |