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Mango Chia-Tso Chao

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

43

Venues

7

Active years

1999–2026

Best venue rank

A*

Where they publish

Papers

43 indexed papers, newest first.

YearVenueTitleAuthors
2026VTSDefect-based Testing for SRAM Address Decoders.Ho-Jie Hsu, Hsien-Chen Lee, Chun-Yu Shen, Po-Tsang Huang, Shih-Chieh Lin, Yung-Jheng Wang, Ying-Yen Chen, Chien-Yuan Pao, Hung-Yu Lee, Mango Chia-Tso Chao
2025ICCADCOPA: A Congestion-Oriented Pin Assignment Framework for Intra-Block Physical Design Optimization.Shu-Yi Tsai, Yu-Guang Chen, Kun-Min Chen, Sheng-Bing Ke, Chung-Hui Hsieh, Chih-Wei Lin, Mango Chia-Tso Chao
2025VTSTest Methodology for Detecting Defect-Based Hold-Time Faults.Cheng-Hsiang Tsai, Yu-Teng Nien, Guan-You Chen, Mango Chia-Tso Chao
2024ITCWafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant.Shu-Wen Li, Chia-Heng Yen, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao
2024VTSTransformer and Its Variants for Identifying Good Dice in Bad Neighborhoods.Cheng-Che Lu, Chi-Chih Chang, Chia-Heng Yen, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao
2023ITCEnhancing Good-Die-in-Bad-Neighborhood Methodology with Wafer-Level Defect Pattern Information.Ching-Min Liu, Chia-Heng Yen, Shu-Wen Lee, Kai-Chiang Wu, Mango Chia-Tso Chao
2023VTSOutlier Detection for Analog Tests Using Deep Learning Techniques.Chin-Kuan Lin, Cheng-Che Lu, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao
2021VTSIdentifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks.Cheng-Hao Yang, Chia-Heng Yen, Ting-Rui Wang, Chun-Teng Chen, Mason Chern, Ying-Yen Chen, Jih-Nung Lee, Shu-Yi Kao, Kai-Chiang Wu, Mango Chia-Tso Chao
2020VTSCNN-based Stochastic Regression for IDDQ Outlier Identification.Chun-Teng Chen, Chia-Heng Yen, Cheng-Yen Wen, Cheng-Hao Yang, Kai-Chiang Wu, Mason Chern, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao
2019ITCMethodology of Generating Timing-Slack-Based Cell-Aware Tests.Yu-Teng Nien, Kai-Chiang Wu, Dong-Zhen Lee, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao
2017VTSFast WAT test structure for measuring Vt variance based on latch-based comparators.Kao-Chi Lee, Kai-Chiang Wu, Chih-Ying Tsai, Mango Chia-Tso Chao
2015ITCTesting methods for quaternary content addressable memory using charge-sharing sensing scheme.Hao-Yu Yang, Rei-Fu Huang, Chin-Lung Su, Kuan-Hong Lin, Hang-Kaung Shu, Chi-Wei Peng, Mango Chia-Tso Chao
2015VTSStatistical techniques for predicting system-level failure using stress-test data.Harry H. Chen, Shih-Hua Kuo, Jonathan Tung, Mango Chia-Tso Chao
2015VTSRandom pattern generation for post-silicon validation of DDR3 SDRAM.Hao-Yu Yang, Shih-Hua Kuo, Tzu-Hsuan Huang, Chi-Hung Chen, Chris Lin, Mango Chia-Tso Chao
2014VTSTesting methods for a write-assist disturbance-free dual-port SRAM.Hao-Yu Yang, Chen-Wei Lin, Chao-Ying Huang, Ching-Ho Lu, Chen-An Lai, Mango Chia-Tso Chao, Rei-Fu Huang
2013VTSTesting retention flip-flops in power-gated designs.Hao-Wen Hsu, Shih-Hua Kuo, Wen-Hsiang Chang, Shi-Hao Chen, Ming-Tung Chang, Mango Chia-Tso Chao
2013VTSInvestigation of gate oxide short in FinFETs and the test methods for FinFET SRAMs.Chen-Wei Lin, Mango Chia-Tso Chao, Chih-Chieh Hsu
2013VTSTesting of a low-VMIN data-aware dynamic-supply 8T SRAM.Chen-Wei Lin, Chin-Yuan Huang, Mango Chia-Tso Chao
2012ASPDACAn Efficient Hamiltonian-cycle power-switch routing for MTCMOS designs.Yi-Ming Wang, Shi-Hao Chen, Mango Chia-Tso Chao
2012DACAlternate hammering test for application-specific DRAMs and an industrial case study.Rei-Fu Huang, Hao-Yu Yang, Mango Chia-Tso Chao, Shih-Chin Lin
2012ITCTesting strategies for a 9T sub-threshold SRAM.Hao-Yu Yang, Chen-Wei Lin, Hung-Hsin Chen, Mango Chia-Tso Chao, Ming-Hsien Tu, Shyh-Jye Jou, Ching-Te Chuang
2011ICCADDetecting stability faults in sub-threshold SRAMs.Chen-Wei Lin, Hao-Yu Yang, Chin-Yuan Huang, Hung-Hsin Chen, Mango Chia-Tso Chao
2011ITCDesign-for-debug layout adjustment for FIB probing and circuit editing.Kuo-An Chen, Tsung-Wei Chang, Meng-Chen Wu, Mango Chia-Tso Chao, Jing-Yang Jou, Sonair Chen
2010ICCADMathematical yield estimation for two-dimensional-redundancy memory arrays.Mango Chia-Tso Chao, Ching-Yu Chin, Chen-Wei Lin
2010ICCADTesting methods for detecting stuck-open power switches in coarse-grain MTCMOS designs.Szu-Pang Mu, Yi-Ming Wang, Hao-Yu Yang, Mango Chia-Tso Chao, Shi-Hao Chen, Chih-Mou Tseng, Tsung-Ying Tsai
2010ITCFault models and test methods for subthreshold SRAMs.Chen-Wei Lin, Hung-Hsin Chen, Hao-Yu Yang, Mango Chia-Tso Chao, Rei-Fu Huang
2010ITCMask versus Schematic - an enhanced design-verification flow for first silicon success.Tseng-Chin Luo, Eric Leong, Mango Chia-Tso Chao, Philip A. Fisher, Wen-Hsiang Chang
2010VTSTheoretical analysis for low-power test decompression using test-slice duplication.Szu-Pang Mu, Mango Chia-Tso Chao
2009DACFault models for embedded-DRAM macros.Mango Chia-Tso Chao, Hao-Yu Yang, Rei-Fu Huang, Shih-Chin Lin, Ching-Yu Chin
2009ICCADPower-switch routing for coarse-grain MTCMOS technologies.Tsun-Ming Tseng, Mango Chia-Tso Chao, Chien Pang Lu, Chen Hsing Lo
2009ITCA novel test flow for one-time-programming applications of NROM technology.Ching-Yu Chin, Yao-Te Tsou, Chi-Min Chang, Mango Chia-Tso Chao
2009ITCA novel array-based test methodology for local process variation monitoring.Tseng-Chin Luo, Mango Chia-Tso Chao, Michael S.-Y. Wu, Kuo-Tsai Li, Chin C. Hsia, Huan-Chi Tseng, Chuen-Uan Huang, Yuan-Yao Chang, Samuel C. Pan, Konrad K.-L. Young
2009VTSMultiple-Fault Diagnosis Using Faulty-Region Identification.Meng-Jai Tasi, Mango Chia-Tso Chao, Jing-Yang Jou, Meng-Chen Wu
2008ITCTesting Methodology of Embedded DRAMs.Chi-Min Chang, Mango Chia-Tso Chao, Rei-Fu Huang, Ding-Yuan Chen
2008VTSScan-Chain Reordering for Minimizing Scan-Shift Power Based on Non-Specified Test Cubes.Yu-Ze Wu, Mango Chia-Tso Chao
2007ICCADA hybrid scheme for compacting test responses with unknown values.Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei
2006DACUnknown-tolerance analysis and test-quality control for test response compaction using space compactors.Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei
2006DATECoverage loss by using space compactors in presence of unknown values.Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei, Kwang-Ting Cheng
2005ICCADResponse shaper: a novel technique to enhance unknown tolerance for output response compaction.Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng
2005ICCDChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values.Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng
2004DATEPattern Selection for Testing of Deep Sub-Micron Timing Defects.Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng
2001ICCDGeneric ILP-Based Approaches for Dynamically Reconfigurable FPGA Partitioning.Guang-Ming Wu, Jai-Ming Lin, Mango Chia-Tso Chao, Yao-Wen Chang
1999ICCADA clustering- and probability-based approach for time-multiplexed FPGA partitioning.Mango Chia-Tso Chao, Guang-Ming Wu, Iris Hui-Ru Jiang, Yao-Wen Chang