Defect-based Testing for SRAM Address Decoders.

Ho-Jie Hsu, Hsien-Chen Lee, Chun-Yu Shen, Po-Tsang Huang, Shih-Chieh Lin, Yung-Jheng Wang, Ying-Yen Chen, Chien-Yuan Pao, Hung-Yu Lee, Mango Chia-Tso Chao

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