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Ying-Yen Chen

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

14

Venues

5

Active years

2005–2026

Best venue rank

A*

Where they publish

Papers

14 indexed papers, newest first.

YearVenueTitleAuthors
2026VTSDefect-based Testing for SRAM Address Decoders.Ho-Jie Hsu, Hsien-Chen Lee, Chun-Yu Shen, Po-Tsang Huang, Shih-Chieh Lin, Yung-Jheng Wang, Ying-Yen Chen, Chien-Yuan Pao, Hung-Yu Lee, Mango Chia-Tso Chao
2022DATEImproving Cell-Aware Test for Intra-Cell Short Defects.Dong-Zhen Lee, Ying-Yen Chen, Kai-Chiang Wu, Mango C.-T. Chao
2021VTSIdentifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks.Cheng-Hao Yang, Chia-Heng Yen, Ting-Rui Wang, Chun-Teng Chen, Mason Chern, Ying-Yen Chen, Jih-Nung Lee, Shu-Yi Kao, Kai-Chiang Wu, Mango Chia-Tso Chao
2020VTSCNN-based Stochastic Regression for IDDQ Outlier Identification.Chun-Teng Chen, Chia-Heng Yen, Cheng-Yen Wen, Cheng-Hao Yang, Kai-Chiang Wu, Mason Chern, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao
2019ITCMethodology of Generating Timing-Slack-Based Cell-Aware Tests.Yu-Teng Nien, Kai-Chiang Wu, Dong-Zhen Lee, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao
2019VTSLayout-Based Dual-Cell-Aware Tests.Tse-Wei Wu, Dong-Zhen Lee, Yu-Hao Huang, Mango C.-T. Chao, Kai-Chiang Wu, Shu-Yi Kao, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee
2017ASPDACPredicting Vt variation and static IR drop of ring oscillators using model-fitting techniques.Tzu-Hsuan Huang, Wei-Tse Hung, Hao-Yu Yang, Wen-Hsiang Chang, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao
2017VTSMethodology of generating dual-cell-aware tests.Yu-Hao Huang, Ching-Ho Lu, Tse-Wei Wu, Yu-Teng Nien, Ying-Yen Chen, Max Wu, Jih-Nung Lee, Mango C.-T. Chao
2016VTSPredicting Vt mean and variance from parallel Id measurement with model-fitting technique.Chih-Ying Tsai, Kao-Chi Lee, Chien-Hsueh Lin, Sung-Chu Yu, Wen-Rong Liau, Alex Chun-Liang Hou, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao
2014ITCDivide and conquer diagnosis for multiple defects.Shih-Min Chao, Po-Juei Chen, Jing-Yu Chen, Po-Hao Chen, Ang-Feng Lin, James Chien-Mo Li, Pei-Ying Hsueh, Chun-Yi Kuo, Ying-Yen Chen, Jih-Nung Li
2011ASPDACDiagnosis-assisted supply voltage configuration to increase performance yield of cell-based designs.Jing-Jia Liou, Ying-Yen Chen, Chun-Chia Chen, Chung-Yen Chien, Kuo-Li Wu
2007DACExtraction of Statistical Timing Profiles Using Test Data.Ying-Yen Chen, Jing-Jia Liou
2007VTSHandling Pattern-Dependent Delay Faults in Diagnosis.Jyun-Wei Chen, Ying-Yen Chen, Jing-Jia Liou
2005ITCDiagnosis framework for locating failed segments of path delay faults.Ying-Yen Chen, Min-Pin Kuo, Jing-Jia Liou