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Masahiro Ishida

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

34

Venues

4

Active years

1991–2019

Best venue rank

A

Where they publish

Papers

34 indexed papers, newest first.

YearVenueTitleAuthors
2019ITCA Jitter Injection Module for Production Test of 52-Gbps PAM4 Signal Interfaces.Kiyotaka Ichiyama, Takashi Kusaka, Masahiro Ishida
2018ITCA Stressed Eye Testing Module for Production Test of 30-Gbps NRZ Signal Interfaces.Kiyotaka Ichiyama, Takashi Kusaka, Masahiro Ishida
2017ETSExtension of power supply impedance emulation method on ATE for multiple power domain.Naoki Terao, Toru Nakura, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada
2017ITCA jitter separation and BER estimation method for asymmetric total jitter distributions.Masahiro Ishida, Kiyotaka Ichiyama
2017VTSInnovative practices session 9B innovative practices in Asia-1: From quality perspective.Kazumi Hatayama, Masahiro Ishida
2017VTSInnovative practices session 10B innovative practices in Asia-2: From cost perspective.Kazumi Hatayama, Masahiro Ishida
2016ITCPower supply impedance emulation to eliminate overkills and underkills due to the impedance difference between ATE and customer board.Toru Nakura, Naoki Terao, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada
2015ITCAn ATE system for testing 2.4-GHz RF digital communication devices with QAM signal interfaces.Masahiro Ishida, Kiyotaka Ichiyama
2015ITCA new method for measuring alias-free aperture jitter in an ADC output.Takahiro J. Yamaguchi, Katsuhiko Degawa, Masayuki Kawabata, Masahiro Ishida, Koichiro Uekusa, Mani Soma
2014ITCStatistical silicon results of dynamic power integrity control of ATE for eliminating overkills and underkills.Masahiro Ishida, Takashi Kusaka, Toru Nakura, Satoshi Komatsu, Kunihiro Asada
2014VTSSpecial session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test.Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma, Terri S. Fiez, Mike Peng Li
2013ITCA functional test of 2-GHz/4-GHz RF digital communication device using digital tester.Kiyotaka Ichiyama, Masahiro Ishida, Kenichi Nagatani, Toshifumi Watanabe
2012ITCReal-time testing method for 16 Gbps 4-PAM signal interface.Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu
2012ITCPower integrity control of ATE for emulating power supply fluctuations on customer environment.Masahiro Ishida, Toru Nakura, Toshiyuki Kikkawa, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada
2011ITCReal-time testing method for 16 Gbps 4-PAM signal interface.Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu
2009ITCA robust method for identifying a deterministic jitter model in a total jitter distribution.Takahiro J. Yamaguchi, Kiyotaka Ichiyama, X. H. Hou, Masahiro Ishida
2008ITCA New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing.Takahiro J. Yamaguchi, Masayuki Kawabata, Mani Soma, Masahiro Ishida, K. Sawami, Koichiro Uekusa
2007ISCASAn On-Chip Delta-Time-to-Voltage Converter for Real-Time Measurement of Clock Jitter.Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma
2007ITCData jitter measurement using a delta-time-to-voltage converter method.Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma
2007ITCAn FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time.Takahiro J. Yamaguchi, H. X. Hou, Koji Takayama, Dave Armstrong, Masahiro Ishida, Mani Soma
2006ITCA Real-Time Delta-Time-to-Voltage Converter for Clock Jitter Measurement.Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma
2006ITCA Study of Per-Pin Timing Jitter Scope.Takahiro J. Yamaguchi, Satoshi Iwamoto, Masahiro Ishida, Mani Soma
2005ITCA wideband low-noise ATE-based method for measuring jitter in GHz signals.Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma
2004ITCA Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems.Takahiro J. Yamaguchi, Masahiro Ishida, Kiyotaka Ichiyama, Mani Soma, Christian Krawinkel, Katsuaki Ohsawa, Masao Sugai
2003ITCEffects of Deterministic Jitter in a Cable on Jitter Tolerance Measurements.Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Makoto Kurosawa, Hirobumi Musha
2002ITCA New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter.Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Hirobumi Musha, Louis Malarsie
2002VTSTiming Jitter Measurement of 10 Gbps Bit Clock Signals Using Frequency Division.Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Louis Malarsie, Hirobumi Musha
2001ITCTesting clock distribution circuits using an analytic signal method.Takahiro J. Yamaguchi, Mani Soma, Jim Nissen, David Halter, Rajesh Raina, Masahiro Ishida
2001VTSA Method for Measuring the Cycle-to-Cycle Period Jitter of High-Frequency Clock Signals.Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, David Halter, Rajesh Raina, Jim Nissen
2000ITCJitter measurements of a PowerPCTakahiro J. Yamaguchi, Mani Soma, David Halter, Jim Nissen, Rajesh Raina, Masahiro Ishida, Toshifumi Watanabe
2000VTSExtraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method.Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Toshifumi Watanabe, Tadahiro Ohmi
1998VTSCOMPACT: A Hybrid Method for Compressing Test Data.Masahiro Ishida, Dong Sam Ha, Takahiro J. Yamaguchi
1997ITCAn Efficient Method for Compressing Test Data.Takahiro J. Yamaguchi, Masahiro Ishida, Marco Tilgner, Dong Sam Ha
1991ITCProgramming for Parallel Pattern Generators.M. Kanzaki, Masahiro Ishida