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Masao Aso

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

4

Venues

3

Active years

2011–2020

Best venue rank

National

Where they publish

Papers

4 indexed papers, newest first.

YearVenueTitleAuthors
2020IOLTSOn-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test.Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yukiya Miura
2020VTSInnovative Test Practices in Asia.Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Yukiya Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi, Kazumi Hatayama
2012VTSA novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits.Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara
2011DATETransition-Time-Relation based capture-safety checking for at-speed scan test generation.Kohei Miyase, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara