Maurice Lousberg
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
13
Venues
4
Active years
1998–2007
Best venue rank
A
Where they publish
Papers
13 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2007 | VTS | Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. | Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
| 2007 | VTS | Diagnosis of Full Open Defects in Interconnecting Lines. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
| 2005 | DATE | Memory Testing Under Different Stress Conditions: An Industrial Evaluation. | Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen |
| 2005 | VTS | A New Algorithm for Dynamic Faults Detection in RAMs. | Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg |
| 2003 | VTS | Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. | Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger |
| 2002 | ITC | An Effective Diagnosis Method to Support Yield Improvement. | Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg |
| 2001 | ITC | CTL the language for describing core-based test. | Rohit Kapur, Maurice Lousberg, Tony Taylor, Brion L. Keller, Paul Reuter, Douglas Kay |
| 2001 | VTS | IP and Automation to Support IEEE P1500. | Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti |
| 2000 | ITC | Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? | Will R. Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg |
| 2000 | ITC | Wrapper design for embedded core test. | Yervant Zorian, Erik Jan Marinissen, Maurice Lousberg, Sandeep Kumar Goel |
| 1999 | ETS | The role of test protocols in testing embedded-core-based system ICs. | Erik Jan Marinissen, Maurice Lousberg |
| 1999 | ITC | Static component interconnect test technology (SCITT) a new technology for assembly testing. | Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg |
| 1998 | ITC | A structured and scalable mechanism for test access to embedded reusable cores. | Erik Jan Marinissen, Robert G. J. Arendsen, Gerard Bos, Hans Dingemanse, Maurice Lousberg, Clemens Wouters |