| 2013 | DATE | A new paradigm for trading off yield, area and performance to enhance performance per wafer. | Yue Gao, Melvin A. Breuer, Yanzhi Wang |
| 2013 | DATE | Using explicit output comparisons for fault tolerant scheduling (FTS) on modern high-performance processors. | Yue Gao, Sandeep K. Gupta, Melvin A. Breuer |
| 2013 | VTS | Trading off area, yield and performance via hybrid redundancy in multi-core architectures. | Yue Gao, Yang Zhang, Da Cheng, Melvin A. Breuer |
| 2012 | ITC | A design flow to maximize yield/area of physical devices via redundancy. | Mohammad Mirza-Aghatabar, Melvin A. Breuer, Sandeep K. Gupta |
| 2010 | DAC | Hardware that produces bounded rather than exact results. | Melvin A. Breuer |
| 2010 | DATE | Algorithms to maximize yield and enhance yield/area of pipeline circuitry by insertion of switches and redundant modules. | Mohammad Mirza-Aghatabar, Melvin A. Breuer, Sandeep K. Gupta |
| 2009 | ITC | Tolerance of performance degrading faults for effective yield improvement. | Tong-Yu Hsieh, Melvin A. Breuer, Murali Annavaram, Sandeep K. Gupta, Kuen-Jong Lee |
| 2008 | VTS | Basing Acceptable Error-Tolerant Performance on Significance-Based Error-rate (SBER). | Zhaoliang Pan, Melvin A. Breuer |
| 2007 | DATE | Reduction of detected acceptable faults for yield improvement via error-tolerance. | Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer |
| 2006 | DATE | STAX: statistical crosstalk target set compaction. | Shahin Nazarian, Massoud Pedram, Sandeep K. Gupta, Melvin A. Breuer |
| 2006 | VTS | An Error-Oriented Test Methodology to Improve Yield with Error-Tolerance. | Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer |
| 2005 | DSD | Multi-media Applications and Imprecise Computation. | Melvin A. Breuer |
| 2005 | ITC | Multiple tests for each gate delay fault: higher coverage and lower test application cost. | Shahdad Irajpour, Sandeep K. Gupta, Melvin A. Breuer |
| 2005 | ITC | A novel test methodology based on error-rate to support error-tolerance. | Kuen-Jong Lee, Tong-Yu Hsieh, Melvin A. Breuer |
| 2004 | ITC | Timing-Independent Testing of Crosstalk in the Presence of Delay Producing Defects Using Surrogate Fault Models. | Shahdad Irajpour, Sandeep K. Gupta, Melvin A. Breuer |
| 2003 | VTS | Test Generation for Maximizing Ground Bounce Considering Circuit Delay. | Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer |
| 2003 | VTS | Analyzing Crosstalk in the Presence of Weak Bridge Defects. | Shahdad Irajpour, Shahin Nazarian, Lei Wang, Sandeep K. Gupta, Melvin A. Breuer |
| 2002 | ICCD | Accurate and Efficient Static Timing Analysis with Crosstalk. | I-De Huang, Sandeep K. Gupta, Melvin A. Breuer |
| 2002 | ITC | XIDEN: Crosstalk Target Identification Framework. | Shahin Nazarian, Hang Huang, Suriyaprakash Natarajan, Sandeep K. Gupta, Melvin A. Breuer |
| 2001 | DAC | A New Gate Delay Model for Simultaneous Switching and Its Applications. | Liang-Chi Chen, Sandeep K. Gupta, Melvin A. Breuer |
| 2001 | ITC | Crosstalk test generation on pseudo industrial circuits: a case study. | Liang-Chi Chen, T. M. Mak, Sandeep K. Gupta, Melvin A. Breuer |
| 2001 | ITC | Switch-level delay test of domino logic circuits. | Suriyaprakash Natarajan, Sandeep K. Gupta, Melvin A. Breuer |
| 2001 | VTS | Test Generation for Maximizing Ground Bounce for Internal Circuitry with Reconvergent Fan-out. | Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer |
| 2000 | VLSID | New Validation and Test Problems for High Performance Deep Submicron VLSI Circuits. | Melvin A. Breuer, Sandeep K. Gupta |
| 2000 | VTS | High End and Low End Applications for Defective Chips: Enhanced Availability and Acceptability. | Melvin A. Breuer |
| 1999 | ICCAD | Validation and test generation for oscillatory noise in VLSI interconnects. | Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer |
| 1999 | ITC | Test generation for crosstalk-induced delay in integrated circuits. | Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer |
| 1999 | ITC | Switch-level delay test. | Suriyaprakash Natarajan, Sandeep K. Gupta, Melvin A. Breuer |
| 1999 | VTS | Test Generation for Ground Bounce in Internal Logic Circuitry. | Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer |
| 1998 | DAC | Introducing Redundant Computations in a Behavior for Reducing BIST Resources. | Ishwar Parulkar, Sandeep K. Gupta, Melvin A. Breuer |
| 1998 | DATE | Scheduling and Module Assignment for Reducing Bist Resources. | Ishwar Parulkar, Sandeep K. Gupta, Melvin A. Breuer |
| 1998 | ITC | Test generation in VLSI circuits for crosstalk noise. | Weiyu Chen, Sandeep K. Gupta, Melvin A. Breuer |
| 1997 | ITC | Analytic Models for Crosstalk Delay and Pulse Analysis Under Non-Ideal Inputs. | Weiyu Chen, Melvin A. Breuer, Sandeep K. Gupta |
| 1997 | VTS | Will 0.1um Digital Circuits Require Mixed-Signal Testing. | Melvin A. Breuer, Bozena Kaminska, John E. McDermid, V. Rayapathi, Donald L. Wheater |
| 1997 | VTS | Analysis of Ground Bounce in Deep Sub-Micron Circuits. | Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer |
| 1997 | VTS | High Quality Robust Tests for Path Delay Faults. | Liang-Chi Chen, Sandeep K. Gupta, Melvin A. Breuer |
| 1996 | DAC | Lower Bounds on Test Resources for Scheduled Data Flow Graphs. | Ishwar Parulkar, Sandeep K. Gupta, Melvin A. Breuer |
| 1996 | ITC | Process-Aggravated Noise (PAN): New Validation and Test Problems. | Melvin A. Breuer, Sandeep K. Gupta |
| 1995 | DAC | Data Path Allocation for Synthesizing RTL Designs with Low BIST Area Overhead. | Ishwar Parulkar, Sandeep K. Gupta, Melvin A. Breuer |
| 1995 | VTS | Asynchronous multiple scan chain. | Sridhar Narayanan, Melvin A. Breuer |
| 1994 | DAC | Extraction of a High-level structural Representation from Circuit Descriptions with Applications to DFT/BIST. | Ishwar Parulkar, Melvin A. Breuer, Charles Njinda |
| 1994 | ITC | Control Strategies for Chip-Based DFT/BIST Hardware. | Debaditya Mukherjee, Massoud Pedram, Melvin A. Breuer |
| 1994 | VTS | Test embedding with discrete logarithms. | Mody Lempel, Sandeep K. Gupta, Melvin A. Breuer |
| 1993 | DAC | An Efficient Partitioning Strategy for Pseudo-Exhaustive Testing. | Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A. Breuer |
| 1993 | ICCAD | Merging multiple FSM controllers for DFT/BIST hardware. | Debaditya Mukherjee, Massoud Pedram, Melvin A. Breuer |
| 1993 | ICCAD | Reconfigurable scan chains: a novel approach to reduce test application time. | Sridhar Narayanan, Melvin A. Breuer |
| 1993 | ITC | Novel Test Pattern Generators for Pseudo-Exhaustive Testing. | Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A. Breuer |
| 1992 | DAC | SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits. | Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer |
| 1992 | ICCAD | Configuring multiple scan chains for minimum test time. | Sridhar Narayanan, Rajesh Gupta, Melvin A. Breuer |
| 1992 | ITC | Optimal Sequencing of Scan Registers. | Sridhar Narayanan, Charles Njinda, Melvin A. Breuer |
| 1992 | VTS | Testability properties of acyclic structures and applications to partial scan design. | Rajesh Gupta, Melvin A. Breuer |
| 1991 | ICCAD | Ordering Storage Elements in a Single Scan Chain. | Rajesh Gupta, Melvin A. Breuer |
| 1991 | ICCAD | A Systematic Approach for Designing Testable VLSI Circuits. | Sen-Pin Lin, Charles Njinda, Melvin A. Breuer |
| 1991 | ICCAD | Synthesis of Optimal 1-Hot Coded On-Chip Controllers for BIST Hardware. | Debaditya Mukherjee, Charles Njinda, Melvin A. Breuer |
| 1991 | ITC | Maximal Diagnosis for Wiring Networks. | Jung-Cheun Lien, Melvin A. Breuer |
| 1991 | VTS | Constraints for using IDDQ testing to detect CMOS bridging faults. | Kuen-Jong Lee, Melvin A. Breuer |
| 1991 | VTS | A partitioning method for achieving maximal test concurrency in pseudo-exhaustive testing. | Rajagopalan Srinivasan, Charles Njinda, Melvin A. Breuer |
| 1990 | ICCAD | A New Method for Assigning Signal Flow Directions to MOS Transistors. | Kuen-Jong Lee, Rajiv Gupta, Melvin A. Breuer |
| 1990 | ITC | Obstacles and an approach towards concurrent engineering. | Melvin A. Breuer |
| 1990 | ITC | On the charge sharing problem in CMOS stuck-open fault testing. | Kuen-Jong Lee, Melvin A. Breuer |
| 1988 | ICCAD | Cbase 1.0: a CAD database for VLSI circuits using object oriented technology. | Melvin A. Breuer, Wesley H. Cheng, Rajiv Gupta, Ido Hardonag, Ellis Horowitz, S. Y. Lin |
| 1988 | ICCD | Fault tolerance and testing aspects of an architecture for a generalized sidelobe cancellor. | Melvin A. Breuer, Amitava Majumdar, Cauligi S. Raghavendra |
| 1988 | ICCD | The POTATO chip architecture: a study in tradeoffs for signal processing chip design. | B. Sharma, Rajiv Jain, Melvin A. Breuer, Alice C. Parker, Cauligi S. Raghavendra, C. Y. Tseng |
| 1988 | ITC | A Test and Maintenance Controller for a Module Containing Testable Chips. | Melvin A. Breuer, Jung-Cheun Lien |
| 1988 | ITC | Concurrent Control of Multiple BIT Structures. | Sandeep K. Gupta, Melvin A. Breuer, Jung-Cheun Lien |
| 1986 | ITC | Scan Path with Look Ahead Shifting (SPLASH). | Magdy S. Abadir, Melvin A. Breuer |
| 1985 | DAC | A knowledge based system for selecting a test methodology for a PLA. | Melvin A. Breuer, Xi-an Zhu |
| 1985 | DAC | The construction of minimal area power and ground nets for VLSI circuits. | Salim U. Chowdhury, Melvin A. Breuer |
| 1983 | DAC | A placement algorithm for array processors. | Dah-Juh Chyan, Melvin A. Breuer |
| 1983 | DAC | A module interchange placement machine. | Alexander Iosupovicz, Clarence King, Melvin A. Breuer |
| 1982 | DAC | A survey of the state-of-the-art of design automation an invited presentation. | Melvin A. Breuer |
| 1982 | DAC | Optimum placement of two rectangular blocks. | Mandalagiri S. Chandrasekhar, Melvin A. Breuer |
| 1982 | DAC | On routing for custom integrated circuits. | Zahir A. Syed, Abbas El Gamal, Melvin A. Breuer |
| 1981 | DAC | Digital system simulation: Current status and future trends or darwin's theory of simulation. | Melvin A. Breuer, Alice C. Parker |
| 1980 | DAC | Fault diagnosis based on effect-cause analysis: An introduction. | Miron Abramovici, Melvin A. Breuer |
| 1979 | DAC | Incremental processing applied to Steinberg's placement procedure. | Harold W. Carter, Melvin A. Breuer, Zahir A. Syed |
| 1977 | DAC | Concurrent fault simulation and functional level modeling. | Miron Abramovici, Melvin A. Breuer, K. Kumar |
| 1977 | DAC | Some theoretical aspects of algorithmic routing. | Prathima Agrawal, Melvin A. Breuer |
| 1977 | DAC | A class of min-cut placement algorithms. | Melvin A. Breuer |
| 1974 | DAC | Initial design concepts for an advanced design automation system. | Melvin A. Breuer, Arthur D. Friedman |
| 1968 | FOCS | Fault Detection in a Linear Cascade of Identical Machines | Melvin A. Breuer |
| 1966 | DAC | The application of integer programming in design automation. | Melvin A. Breuer |