Nabil Badereddine
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
12
Venues
6
Active years
2010–2013
Best venue rank
A*
Where they publish
Papers
12 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2013 | DATE | Test solution for data retention faults in low-power SRAMs. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2013 | ETS | Analyzing resistive-open defects in SRAM core-cell under the effect of process variability. | Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2013 | ITC | On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2013 | VTS | A built-in scheme for testing and repairing voltage regulators of low-power srams. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2012 | ETS | Defect analysis in power mode control logic of low-power SRAMs. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2012 | ITC | Low-power SRAMs power mode control logic: Failure analysis and test solutions. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2011 | DDECS | Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
| 2011 | ITC | On using address scrambling to implement defect tolerance in SRAMs. | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
| 2010 | DAC | A statistical simulation method for reliability analysis of SRAM core-cells. | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
| 2010 | ETS | Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes. | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
| 2010 | ETS | Setting test conditions for improving SRAM reliability. | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
| 2010 | VTS | Detecting NBTI induced failures in SRAM core-cells. | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |