Nagesh Tamarapalli
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
17
Venues
2
Active years
1996–2015
Best venue rank
A
Where they publish
Papers
17 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2015 | VLSID | Tutorial T5: High Performance Low Power Designs - Challenges and Best practices in Design, Verification and Test. | Nagesh Tamarapalli, Prashanth Vallur, Sachin Kulkarni |
| 2014 | VLSID | Application of Test-View Modeling to Hierarchical ATPG. | Rahul Shukla, Phong Loi, Ken Pham, Arie Margulis, Kathy Yang, Nagesh Tamarapalli |
| 2013 | VLSID | Tutorial T10: Post - Silicon Validation, Debug and Diagnosis. | Prabhat Mishra, Masahiro Fujita, Virendra Singh, Nagesh Tamarapalli, Sharad Kumar, Rajesh Mittal |
| 2012 | VLSID | Tutorial T3: DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. | Srikanth Venkataraman, Nagesh Tamarapalli |
| 2008 | VLSID | DFM / DFT / SiliconDebug / Diagnosis. | Srikanth Venkataraman, Nagesh Tamarapalli |
| 2006 | ITC | Diagnosis with Limited Failure Information. | Yu Huang, Wu-Tung Cheng, Nagesh Tamarapalli, Janusz Rajski, Randy Klingenberg, Will Hsu, Yuan-Shih Chen |
| 2006 | ITC | A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. | Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware |
| 2006 | ITC | Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis. | Nandu Tendolkar, Dawit Belete, Bill Schwarz, Bob Podnar, Akshay Gupta, Steve Karako, Wu-Tung Cheng, Alex Babin, Kun-Han Tsai, Nagesh Tamarapalli, Greg Aldrich |
| 2006 | VLSID | DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. | David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman |
| 2005 | ITC | Compression mode diagnosis enables high volume monitoring diagnosis flow. | Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai |
| 2005 | ITC | Achieving higher yield through diagnosis. | Nagesh Tamarapalli |
| 2003 | ITC | Impact of Multiple-Detect Test Patterns on Product Quality. | Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski |
| 2003 | ITC | Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. | Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski |
| 2002 | ITC | Embedded Deterministic Test for Low-Cost Manufacturing Test. | Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian |
| 1999 | ITC | Logic BIST for large industrial designs: real issues and case studies. | Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski |
| 1998 | ITC | Automated synthesis of large phase shifters for built-in self-test. | Janusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer |
| 1996 | ITC | Constructive Multi-Phase Test Point Insertion for Scan-Based BIST. | Nagesh Tamarapalli, Janusz Rajski |