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Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis.

Nandu Tendolkar, Dawit Belete, Bill Schwarz, Bob Podnar, Akshay Gupta, Steve Karako, Wu-Tung Cheng, Alex Babin, Kun-Han Tsai, Nagesh Tamarapalli, Greg Aldrich

VenueAITC
Year2006
ProceedingsITC

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