Wu-Tung Cheng
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
81
Venues
10
Active years
1985–2025
Best venue rank
A*
Where they publish
Papers
81 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | ITC | Using Distinguishing Bits to Improve Chain Diagnosis Coverage for Silicon Defects. | Wu-Tung Cheng, Manish Sharma, Artur Stelmach, Jakub Janicki, Preston McWithey, Gaurav Veda, Szczepan Urban, Jayant D'Souza |
| 2025 | VTS | APT: Optimal Tree for Diagnosis Simulation. | Wu-Tung Cheng |
| 2025 | VTS | Innovation Practices Track: Frontiers in Diagnosis and Debug. | Suriyaprakash Natarajan, Saghir A. Shaikh, Wu-Tung Cheng, Sankaran Menon |
| 2024 | ITC | Adaptive Diagnosis Points for 100% Chain Diagnosis Coverage. | Wu-Tung Cheng, Manish Sharma, Xin Yang, Artur Stelmach, Szczepan Urban, Jakub Janicki, Preston McWithey |
| 2022 | ITC | Industry Evaluation of Reversible Scan Chain Diagnosis. | Soumya Mittal, Szczepan Urban, Kun Young Chung, Jakub Janicki, Wu-Tung Cheng, Martin Parley, Manish Sharma, Shaun Nicholson |
| 2022 | VTS | Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations. | Shi-Xuan Zheng, Chung-Yu Yeh, Kuen-Jong Lee, Chen Wang, Wu-Tung Cheng, Mark Kassab, Janusz Rajski, Sudhakar M. Reddy |
| 2020 | ETS | Efficient Prognostication of Pattern Count with Different Input Compression Ratios. | Fong-Jyun Tsai, Chong-Siao Ye, Yu Huang, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski |
| 2020 | ITC | Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations. | Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada |
| 2019 | ASPDAC | Improving scan chain diagnostic accuracy using multi-stage artificial neural networks. | Mason Chern, Shih-Wei Lee, Shi-Yu Huang, Yu Huang, Gaurav Veda, Kun-Han Hans Tsai, Wu-Tung Cheng |
| 2019 | ETS | A supervised machine learning application in volume diagnosis. | Yue Tian, Gaurav Veda, Wu-Tung Cheng, Manish Sharma, Huaxing Tang, Neerja Bawaskar, Sudhakar M. Reddy |
| 2019 | VTS | On Cyclic Scan Integrity Tests for EDT-based Compression. | Wu-Tung Cheng, Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer |
| 2017 | ETS | Volume diagnosis data mining. | Wu-Tung Cheng, Yue Tian, Sudhakar M. Reddy |
| 2016 | ETS | Testing of small delay faults in a clock network. | Shaofu Yang, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng |
| 2016 | ITC | Online slack-time binning for IO-registered die-to-die interconnects. | Chih-Chieh Zheng, Shi-Yu Huang, Shyue-Kung Lu, Ting-Chi Wang, Kun-Han Tsai, Wu-Tung Cheng |
| 2015 | DATE | Feedback-bus oscillation ring: a general architecture for delay characterization and test of interconnects. | Shi-Yu Huang, Meng-Ting Tsai, Kun-Han Hans Tsai, Wu-Tung Cheng |
| 2015 | ETS | Advancements in diagnosis driven yield analysis (DDYA): A survey of state-of-the-art scan diagnosis and yield analysis technologies. | Yu Huang, Wu Yang, Wu-Tung Cheng |
| 2015 | ITC | Monitoring the delay of long interconnects via distributed TDC. | Meng-Ting Tsai, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng |
| 2015 | VLSID | Embedded Tutorial ET2: Volume Diagnosis for Yield Improvement. | Wu-Tung Cheng, Sudhakar M. Reddy |
| 2014 | ETS | On-the-fly timing-aware built-in self-repair for high-speed interposer wires in 2.5-D ICs. | Shi-Yu Huang, Zeng-Fu Zeng, Kun-Han Tsai, Wu-Tung Cheng |
| 2013 | IOLTS | At-speed BIST for interposer wires supporting on-the-spot diagnosis. | Shi-Yu Huang, Jeo-Yen Lee, Kun-Han Tsai, Wu-Tung Cheng |
| 2013 | ITC | Delay testing and characterization of post-bond interposer wires in 2.5-D ICs. | Shi-Yu Huang, Li-Ren Huang, Kun-Han Tsai, Wu-Tung Cheng |
| 2013 | ITC | EDT bandwidth management - Practical scenarios for large SoC designs. | Jakub Janicki, Jerzy Tyszer, Wu-Tung Cheng, Yu Huang, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski, Yan Dong, Grady Giles |
| 2013 | ITC | Diagnosis and Layout Aware (DLA) scan chain stitching. | Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan |
| 2013 | VTS | Distributed dynamic partitioning based diagnosis of scan chain. | Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy |
| 2012 | DAC | Small delay testing for TSVs in 3-D ICs. | Shi-Yu Huang, Yu-Hsiang Lin, Kun-Han Tsai, Wu-Tung Cheng, Stephen K. Sunter, Yung-Fa Chou, Ding-Ming Kwai |
| 2012 | ITC | Improved volume diagnosis throughput using dynamic design partitioning. | Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware |
| 2012 | ITC | A unified method for parametric fault characterization of post-bond TSVs. | Yu-Hsiang Lin, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng, Stephen K. Sunter |
| 2011 | ITC | Deterministic IDDQ diagnosis using a net activation based model. | Andras Kun, Ralf Arnold, Peter Heinrich, Gwenol Maugard, Huaxing Tang, Wu-Tung Cheng |
| 2011 | ITC | A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores. | Manish Sharma, Avijit Dutta, Wu-Tung Cheng, Brady Benware, Mark Kassab |
| 2010 | ASPDAC | Emulating and diagnosing IR-drop by using dynamic SDF. | Ke Peng, Yu Huang, Ruifeng Guo, Wu-Tung Cheng, Mohammad Tehranipoor |
| 2010 | ASPDAC | Improved weight assignment for logic switching activity during at-speed test pattern generation. | Meng-Fan Wu, Hsin-Cheih Pan, Teng-Han Wang, Jiun-Lang Huang, Kun-Han Tsai, Wu-Tung Cheng |
| 2010 | ETS | Full-circuit SPICE simulation based validation of dynamic delay estimation. | Ke Peng, Yu Huang, Pinki Mallick, Wu-Tung Cheng, Mohammad Tehranipoor |
| 2010 | ETS | Scan based speed-path debug for a microprocessor. | Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang, Kun-Han Tsai, Ken Amstutz |
| 2010 | ICCAD | A scalable quantitative measure of IR-drop effects for scan pattern generation. | Meng-Fan Wu, Kun-Han Tsai, Wu-Tung Cheng, Hsin-Cheih Pan, Jiun-Lang Huang, Augusli Kifli |
| 2010 | ITC | Case study of scan chain diagnosis and PFA on a low yield wafer. | Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen |
| 2010 | ITC | Test cycle power optimization for scan-based designs. | Kun-Han Tsai, Yu Huang, Wu-Tung Cheng, Ting-Pu Tai, Augusli Kifli |
| 2009 | DATE | Improving compressed test pattern generation for multiple scan chain failure diagnosis. | Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy |
| 2009 | ETS | Speed-Path Debug Using At-Speed Scan Test Patterns. | Ruifeng Guo, Wu-Tung Cheng, Kun-Han Tsai |
| 2008 | ETS | Diagnose Multiple Stuck-at Scan Chain Faults. | Yu Huang, Wu-Tung Cheng, Ruifeng Guo |
| 2008 | ITC | Detection and Diagnosis of Static Scan Cell Internal Defect. | Ruifeng Guo, Liyang Lai, Yu Huang, Wu-Tung Cheng |
| 2008 | ITC | Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. | Stefan Hillebrecht, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng |
| 2008 | ITC | Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. | Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann |
| 2008 | VTS | Reducing Scan Shift Power at RTL. | Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak |
| 2008 | VTS | Automatic Test Pattern Generation for Interconnect Open Defects. | Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng |
| 2007 | ITC | A complete test set to diagnose scan chain failures. | Ruifeng Guo, Yu Huang, Wu-Tung Cheng |
| 2007 | ITC | Diagnose compound scan chain and system logic defects. | Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Will Hsu, Yuan-Shih Chen, Albert Mann |
| 2007 | ITC | Interconnect open defect diagnosis with minimal physical information. | Chen Liu, Wei Zou, Sudhakar M. Reddy, Wu-Tung Cheng, Manish Sharma, Huaxing Tang |
| 2007 | ITC | Faster defect localization in nanometer technology based on defective cell diagnosis. | Manish Sharma, Wu-Tung Cheng, Ting-Pu Tai, Y. S. Cheng, Will Hsu, Chen Liu, Sudhakar M. Reddy, Albert Mann |
| 2007 | VTS | Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary. | Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang |
| 2006 | ITC | Signature Based Diagnosis for Logic BIST. | Wu-Tung Cheng, Manish Sharma, Thomas Rinderknecht, Liyang Lai, Chris Hill |
| 2006 | ITC | Diagnosis with Limited Failure Information. | Yu Huang, Wu-Tung Cheng, Nagesh Tamarapalli, Janusz Rajski, Randy Klingenberg, Will Hsu, Yuan-Shih Chen |
| 2006 | ITC | X-Press Compactor for 1000x Reduction of Test Data. | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab |
| 2006 | ITC | Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis. | Nandu Tendolkar, Dawit Belete, Bill Schwarz, Bob Podnar, Akshay Gupta, Steve Karako, Wu-Tung Cheng, Alex Babin, Kun-Han Tsai, Nagesh Tamarapalli, Greg Aldrich |
| 2006 | VLSID | On Methods to Improve Location Based Logic Diagnosis. | Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang |
| 2005 | ASPDAC | Using fault model relaxation to diagnose real scan chain defects. | Yu Huang, Wu-Tung Cheng, Greg Crowell |
| 2005 | ICCD | Hardware Ef.cient LBISTWith Complementary Weights. | Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng |
| 2005 | ITC | Full-speed field-programmable memory BIST architecture. | Xiaogang Du, Nilanjan Mukherjee, Wu-Tung Cheng, Sudhakar M. Reddy |
| 2005 | ITC | Compressed pattern diagnosis for scan chain failures. | Yu Huang, Wu-Tung Cheng, Janusz Rajski |
| 2005 | ITC | Compression mode diagnosis enables high volume monitoring diagnosis flow. | Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai |
| 2005 | ITC | X-filter: filtering unknowns from compacted test responses. | Manish Sharma, Wu-Tung Cheng |
| 2004 | DATE | Intermittent Scan Chain Fault Diagnosis Based on Signal Probability Analysis. | Yu Huang, Wu-Tung Cheng, Cheng-Ju Hsieh, Huan-Yung Tseng, Alou Huang, Yu-Ting Hung |
| 2004 | ITC | Logic BIST with Scan Chain Segmentation. | Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng |
| 2004 | VLSID | At-Speed Built-in Self-Repair Analyzer for Embedded Word-Oriented Memories. | Xiaogang Du, Sudhakar M. Reddy, Wu-Tung Cheng, Joseph Rayhawk, Nilanjan Mukherjee |
| 2004 | VTS | Memory BIST Using ESP. | Xiaogang Du, Sudhakar M. Reddy, Don E. Ross, Wu-Tung Cheng, Joseph Rayhawk |
| 2004 | VTS | Logic BIST Using Constrained Scan Cells. | Liyang Lai, Thomas Rinderknecht, Wu-Tung Cheng, Janak H. Patel |
| 2003 | DAC | Using embedded infrastructure IP for SOC post-silicon verification. | Yu Huang, Wu-Tung Cheng |
| 2003 | ITC | Silicon Diagnosis. | Wu-Tung Cheng |
| 2003 | ITC | Statistical Diagnosis for Intermittent Scan Chain Hold-Time Fault. | Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Cheng-Ju Hsieh, Yu-Ting Hung |
| 2003 | ITC | BIST for Deep Submicron ASIC Memories with High Performance Application. | Theo J. Powell, Wu-Tung Cheng, Joseph Rayhawk, Omer Samman, Paul Policke, Sherry Lai |
| 2002 | ITC | Optimal Core Wrapper Width Selection and SOC Test Scheduling Based on 3-D Bin Packing Algorithm. | Yu Huang, Sudhakar M. Reddy, Wu-Tung Cheng, Paul Reuter, Nilanjan Mukherjee, Chien-Chung Tsai, Omer Samman, Yahya Zaidan |
| 2002 | VLSID | Constraint Driven Pin Mapping for Concurrent SOC Testing. | Yu Huang, Nilanjan Mukherjee, Chien-Chung Tsai, Omer Samman, Yahya Zaidan, Yanping Zhang, Wu-Tung Cheng, Sudhakar M. Reddy |
| 2001 | ITC | On RTL scan design. | Yu Huang, Chien-Chung Tsai, Nilanjan Mukherjee, Omer Samman, Dan Devries, Wu-Tung Cheng, Sudhakar M. Reddy |
| 2000 | VTS | SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration. | Xijiang Lin, Wu-Tung Cheng, Irith Pomeranz, Sudhakar M. Reddy |
| 1999 | ITC | High time for high level ATPG. | Wu-Tung Cheng |
| 1996 | ITC | A Universal Technique for Accelerating Simulation of Scan Test Patterns. | Bejoy G. Oomman, Wu-Tung Cheng, John A. Waicukauski |
| 1990 | DAC | Proofs: A Fast, Memory Efficient Sequential Circuit Fault Simulator. | Thomas M. Niermann, Wu-Tung Cheng, Janak H. Patel |
| 1990 | ITC | Diagnosis for wiring interconnects. | Wu-Tung Cheng, James L. Lewandowski, Eleanor Wu |
| 1989 | DAC | Differential Fault Simulation - a Fast Method Using Minimal Memory. | Wu-Tung Cheng, Meng-Lin Yu |
| 1988 | DAC | Split Circuit Model for Test Generation. | Wu-Tung Cheng |
| 1988 | ICCD | The BACK algorithm for sequential test generation. | Wu-Tung Cheng |
| 1985 | ITC | Multiple-Fault Detection in Iterative Logic Arrays. | Wu-Tung Cheng, Janak H. Patel |